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Manabu Tomisaka
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Nagoya-city, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Semiconductor device and method of patterning resin insulation laye...
Patent number
8,405,218
Issue date
Mar 26, 2013
Denso Corporation
Manabu Tomisaka
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Formation method of metallic electrode of semiconductor device and...
Patent number
8,263,490
Issue date
Sep 11, 2012
Denso Corporation
Manabu Tomisaka
G01 - MEASURING TESTING
Information
Patent Grant
Metallic electrode forming method and semiconductor device having m...
Patent number
7,910,460
Issue date
Mar 22, 2011
Denso Corporation
Manabu Tomisaka
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Metallic electrode forming method and semiconductor device having m...
Patent number
7,800,232
Issue date
Sep 21, 2010
Denso Corporation
Manabu Tomisaka
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method for manufacturing pressure sensor
Patent number
7,268,008
Issue date
Sep 11, 2007
Denso Corporation
Manabu Tomisaka
G01 - MEASURING TESTING
Information
Patent Grant
Pressure sensor
Patent number
7,036,384
Issue date
May 2, 2006
Denso Corporation
Hiroaki Tanaka
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
SURFACE PROCESSING APPARATUS AND SURFACE PROCESSING METHOD FOR SiC...
Publication number
20220384185
Publication date
Dec 1, 2022
DENSO CORPORATION
Kazufumi AOKI
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SEMICONDUCTOR DEVICE
Publication number
20150048510
Publication date
Feb 19, 2015
Denso Corporation
Manabu Tomisaka
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
MANUFACTURING METHOD OF SEMICONDUCTOR DEVICE
Publication number
20110207264
Publication date
Aug 25, 2011
DENSO CORPORATION
Manabu TOMISAKA
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Formation method of metallic electrode of semiconductor device and...
Publication number
20110207241
Publication date
Aug 25, 2011
DENSO CORPORATION
Manabu Tomisaka
G01 - MEASURING TESTING
Information
Patent Application
SEMICONDUCTOR DEVICE AND METHOD OF PATTERNNING RESIN INSULATION LAY...
Publication number
20110198733
Publication date
Aug 18, 2011
DENSO CORPORATION
Manabu Tomisaka
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Semiconductor device having semiconductor chip and metal plate and...
Publication number
20110042741
Publication date
Feb 24, 2011
DENSO CORPORATION
Daisuke Fukuoka
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Metallic electrode forming method and semiconductor device having m...
Publication number
20100311191
Publication date
Dec 9, 2010
DENSO CORPORATION
Manabu Tomisaka
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Laminated gas sensor and method of producing the same
Publication number
20100288636
Publication date
Nov 18, 2010
DENSO CORPORATION
Masahiro Sone
G01 - MEASURING TESTING
Information
Patent Application
Metallic electrode forming method and semiconductor device having m...
Publication number
20080217771
Publication date
Sep 11, 2008
DENSO CORPORATION
Manabu Tomisaka
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Method for manufacturing pressure sensor
Publication number
20060160263
Publication date
Jul 20, 2006
DENSO CORPORATION
Manabu Tomisaka
G01 - MEASURING TESTING
Information
Patent Application
Pressure sensor
Publication number
20060016267
Publication date
Jan 26, 2006
DENSO Corporation
Hiroaki Tanaka
G01 - MEASURING TESTING
Information
Patent Application
Method for filling blind via holes
Publication number
20030221969
Publication date
Dec 4, 2003
Manabu Tomisaka
C25 - ELECTROLYTIC OR ELECTROPHORETIC PROCESSES APPARATUS THEREFOR