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Manfred Berleth

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  • Eppelheim, DE
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Patents Grantslast 30 patents

  • Information Patent Grant

    Tempering device for a microtome
    • Patent number 7,210,306
    • Issue date May 1, 2007
    • Microm International GmbH
    • Hans L. Heid
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Height-adjustable table for a microtome
    • Patent number 5,988,029
    • Issue date Nov 23, 1999
    • MICROM Laborgerate GmbH
    • Bernd Rottermann
    • A47 - FURNITURE DOMESTIC ARTICLES OR APPLIANCES COFFEE MILLS SPICE MILLS SUCT...
  • Information Patent Grant

    Knife holder for a microtome
    • Patent number 5,851,213
    • Issue date Dec 22, 1998
    • Carl Zeiss Stiftung
    • Manfred Berleth
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Specimen holder clamp for a microtome
    • Patent number 4,695,046
    • Issue date Sep 22, 1987
    • Cambridge Instruments GmbH
    • Manfred Berleth
    • B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
  • Information Patent Grant

    Microtome feed-motor control
    • Patent number 4,691,151
    • Issue date Sep 1, 1987
    • Cambridge Instruments GmbH
    • Werner Behme
    • G05 - CONTROLLING REGULATING
  • Information Patent Grant

    Clamping mechanism for a cutter of a microtome
    • Patent number 4,690,023
    • Issue date Sep 1, 1987
    • Cambridge Instruments Inc.
    • Manfred Berleth
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Microtomes
    • Patent number 4,625,608
    • Issue date Dec 2, 1986
    • Parke, Davis & Company
    • Werner Behme
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Microtome having specimen retraction means
    • Patent number 4,594,929
    • Issue date Jun 17, 1986
    • Parke, Davis & Company
    • Werner Behme
    • G01 - MEASURING TESTING

Patents Applicationslast 30 patents

  • Information Patent Application

    Tempering device for a microtome
    • Publication number 20060005562
    • Publication date Jan 12, 2006
    • MICROM INTERNATIONAL GMBH
    • Hans L. Heid
    • G01 - MEASURING TESTING