Manfred Bitter

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Princeton, NJ, US

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Patents Grantslast 30 patents

Information Patent Grant
Multi-cone x-ray imaging Bragg crystal spectrometer
- Patent number 10,677,744
- Issue date Jun 9, 2020
- U.S. Department of Energy
- Manfred Bitter
- G01 - MEASURING TESTING
Information Patent Grant
Objective for EUV microscopy, EUV lithography, and x-ray imaging
- Patent number 9,329,487
- Issue date May 3, 2016
- Manfred Bitter
- G02 - OPTICS
Information Patent Grant
Non-astigmatic imaging with matched pairs of spherically bent refle...
- Patent number 8,217,353
- Issue date Jul 10, 2012
- U.S. Department of Energy
- Manfred Ludwig Bitter
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Simultaneous measurement of the reflectivity of X-ray with differen...
- Patent number 7,209,542
- Issue date Apr 24, 2007
- Korea Basic Science Institute
- Sang Gon Lee
- G01 - MEASURING TESTING
Information Patent Grant
X-ray tube
- Patent number 6,408,053
- Issue date Jun 18, 2002
- Korea Basic Science Institute
- Sang Gon Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
X-ray imaging crystal spectrometer for extended X-ray sources
- Patent number 6,259,763
- Issue date Jul 10, 2001
- The United States of America as represented by the United States Department o...
- Manfred L. Bitter
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Precise Proton Positioning Method for Proton Therapy Treatment, and...
- Publication number 20180126189
- Publication date May 10, 2018
- The Trustees of Princeton University
- Philip EFTHIMION
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
Novel Objective for EUV Microscopy, EUV Lithography, and X-Ray Imaging
- Publication number 20150055755
- Publication date Feb 26, 2015
- The Trustees of Princeton University
- Manfred Bitter
- G02 - OPTICS
Information Patent Application
Simultaneous measurement of the reflectivity of X-ray with differen...
- Publication number 20060126786
- Publication date Jun 15, 2006
- Sang Gon Lee
- G01 - MEASURING TESTING