Manfred Oswald

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Patents Applicationslast 30 patents

Information Patent Application
Integrated Circuit Arrangement Having a Defect Sensor
- Publication number 20110221460
- Publication date Sep 15, 2011
- Heinrich Trebo
- G01 - MEASURING TESTING
Information Patent Application
Programmable memory with reliability testing of the stored data
- Publication number 20090199058
- Publication date Aug 6, 2009
- Christoph Seidl
- G11 - INFORMATION STORAGE