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Manh Dang Nguyen
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Milpitas, CA, US
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Patents Grants
last 30 patents
Information
Patent Grant
Bandgap measurements of patterned film stacks using spectroscopic m...
Patent number
11,796,390
Issue date
Oct 24, 2023
KLA Corporation
Tianhan Wang
G01 - MEASURING TESTING
Information
Patent Grant
Bandgap measurements of patterned film stacks using spectroscopic m...
Patent number
11,378,451
Issue date
Jul 5, 2022
KLA Corporation
Tianhan Wang
G01 - MEASURING TESTING
Information
Patent Grant
Measurement methodology of advanced nanostructures
Patent number
11,156,548
Issue date
Oct 26, 2021
KLA-Tencor Corporation
Manh Nguyen
G05 - CONTROLLING REGULATING
Patents Applications
last 30 patents
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Patent Application
Bandgap Measurements of Patterned Film Stacks Using Spectroscopic M...
Publication number
20220349752
Publication date
Nov 3, 2022
KLA Corporation
Tianhan Wang
G01 - MEASURING TESTING
Information
Patent Application
Measurement Methodology of Advanced Nanostructures
Publication number
20190178788
Publication date
Jun 13, 2019
KLA-Tencor Corporation
Manh Nguyen
G05 - CONTROLLING REGULATING
Information
Patent Application
Bandgap Measurements of Patterned Film Stacks Using Spectroscopic M...
Publication number
20190041266
Publication date
Feb 7, 2019
KLA-Tencor Corporation
Tianhan Wang
G01 - MEASURING TESTING