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Patents Grants
last 30 patents
Information
Patent Grant
Automatic large-mass-weight handling system
Patent number
11,835,378
Issue date
Dec 5, 2023
National Institute of Metrology
Xiaoping Ren
G01 - MEASURING TESTING
Information
Patent Grant
High accuracy measuring device for measuring large mass
Patent number
10,378,950
Issue date
Aug 13, 2019
National Institute of Metrology
Jian Wang
G01 - MEASURING TESTING
Information
Patent Grant
Measuring device for measuring large mass with optical refraction a...
Patent number
10,274,362
Issue date
Apr 30, 2019
National Institute of Metrology
Jian Wang
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
Automatic Large-Mass-Weight Handling System
Publication number
20230194332
Publication date
Jun 22, 2023
National Institute of Metrology
Xiaoping Ren
G01 - MEASURING TESTING
Information
Patent Application
A High Accuracy Measuring Device for Measuring Large Mass
Publication number
20190086255
Publication date
Mar 21, 2019
National Institute of Metrology
Jian WANG
G01 - MEASURING TESTING
Information
Patent Application
A Measuring Device for Measuring Large Mass with Optical Refraction...
Publication number
20180335337
Publication date
Nov 22, 2018
National Institute of Metrology
Jian WANG
G01 - MEASURING TESTING