Mani Soma

Person

Seattle, WA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Jitter measurement apparatus, jitter measurement method, test appar...
- Patent number 7,957,458
- Issue date Jun 7, 2011
- Advantest Corporation
- Kiyotaka Ichiyama
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Signal-to-noise ratio measurement for discrete waveform
- Patent number 7,778,785
- Issue date Aug 17, 2010
- Advantest Corporation
- Takahiro Yamaguchi
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Measuring apparatus and measuring method
- Patent number 7,636,387
- Issue date Dec 22, 2009
- Advantest Corporation
- Takahiro Yamaguchi
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Test apparatus, clock generator and electronic device
- Patent number 7,596,173
- Issue date Sep 29, 2009
- Advantest Corporation
- Masahiro Ishida
- G01 - MEASURING TESTING
Information Patent Grant
Jitter measuring apparatus, jitter measuring method and PLL circuit
- Patent number 7,564,897
- Issue date Jul 21, 2009
- Advantest Corporation
- Kiyotaka Ichiyama
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for measuring jitter and method of measuring jitter
- Patent number 7,496,137
- Issue date Feb 24, 2009
- Advantest Corporation
- Kiyotaka Ichiyama
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for measuring jitter and method of measuring jitter
- Patent number 7,460,592
- Issue date Dec 2, 2008
- Advantest Corporation
- Takahiro Yamaguchi
- G01 - MEASURING TESTING
Information Patent Grant
Testing device for testing electronic device and testing method the...
- Patent number 7,397,847
- Issue date Jul 8, 2008
- Advantest Corporation
- Masahiro Ishida
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for and method of measuring clock skew
- Patent number 7,356,109
- Issue date Apr 8, 2008
- Advantest Corporation
- Takahiro Yamaguchi
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Characterization of radio frequency (RF) signals using wavelet-base...
- Patent number 7,340,381
- Issue date Mar 4, 2008
- University of Washington
- Mani Soma
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Wideband signal analyzing apparatus, wideband period jitter analyzi...
- Patent number 7,317,309
- Issue date Jan 8, 2008
- Advantest Corporation
- Takahiro Yamaguchi
- G01 - MEASURING TESTING
Information Patent Grant
Test apparatus and test method for testing a device under test
- Patent number 7,313,496
- Issue date Dec 25, 2007
- Advantest Corporation
- Masahiro Ishida
- G01 - MEASURING TESTING
Information Patent Grant
Measurement instrument and measurement method
- Patent number 7,305,025
- Issue date Dec 4, 2007
- Advantest Corporation
- Takahiro Yamaguchi
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Probability estimating apparatus and method for peak-to-peak clock...
- Patent number 7,263,150
- Issue date Aug 28, 2007
- Advantest Corp.
- Masahiro Ishida
- G01 - MEASURING TESTING
Information Patent Grant
Electronic device with integrally formed light emitting device and...
- Patent number 7,253,443
- Issue date Aug 7, 2007
- Advantest Corporation
- Minako Yoshida
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus for and method of measuring jitter
- Patent number 7,203,229
- Issue date Apr 10, 2007
- Advantest Corporation
- Masahiro Ishida
- G01 - MEASURING TESTING
Information Patent Grant
Processing apparatus, processing method and position detecting device
- Patent number 7,193,728
- Issue date Mar 20, 2007
- Advantest Corporation
- Masayoshi Ichikawa
- G01 - MEASURING TESTING
Information Patent Grant
Testing apparatus and testing method
- Patent number 7,136,773
- Issue date Nov 14, 2006
- Advantest Corporation
- Masahiro Ishida
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for and method of measuring clock skew
- Patent number 7,127,018
- Issue date Oct 24, 2006
- Advantest Corporation
- Takahiro Yamaguchi
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Measuring apparatus and measuring method
- Patent number 7,054,358
- Issue date May 30, 2006
- Advantest Corporation
- Takahiro Yamaguchi
- G01 - MEASURING TESTING
Information Patent Grant
Jitter estimating apparatus and estimating method
- Patent number 6,990,417
- Issue date Jan 24, 2006
- Advantest Corporation
- Takahiro Yamaguchi
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Apparatus for and method of measuring jitter
- Patent number 6,922,439
- Issue date Jul 26, 2005
- Advantest Corporation
- Takahiro Yamaguchi
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Charge-based frequency measurement bist
- Patent number 6,885,700
- Issue date Apr 26, 2005
- University of Washington
- Seongwon Kim
- G01 - MEASURING TESTING
Information Patent Grant
Jitter measuring device and method
- Patent number 6,795,496
- Issue date Sep 21, 2004
- Advantest Corporation
- Mani Soma
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for and method of measuring a jitter
- Patent number 6,775,321
- Issue date Aug 10, 2004
- Advantest Corporation
- Mani Soma
- G01 - MEASURING TESTING
Information Patent Grant
Clock skew measuring apparatus and method
- Patent number 6,737,852
- Issue date May 18, 2004
- Advantest Corporation
- Mani Soma
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for measuring quality measure of phase noise w...
- Patent number 6,735,538
- Issue date May 11, 2004
- Advantest Corporation
- Takahiro Yamaguchi
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for and method of measuring a jitter
- Patent number 6,687,629
- Issue date Feb 3, 2004
- Advantest Corporation
- Takahiro Yamaguchi
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for and method of measuring a jitter
- Patent number 6,621,860
- Issue date Sep 16, 2003
- Takahiro Yamaguchi
- G01 - MEASURING TESTING
Information Patent Grant
Jitter measurement apparatus and its method
- Patent number 6,598,004
- Issue date Jul 22, 2003
- Advantest Corporation
- Masahiro Ishida
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
DATA PROCESSING APPARATUS, DATA PROCESSING SYSTEM, MEASUREMENT SYST...
- Publication number 20120102353
- Publication date Apr 26, 2012
- NATIONAL UNIVERSITY CORPORATION TOHOKU UNIVERSITY
- Takahiro YAMAGUCHI
- G01 - MEASURING TESTING
Information Patent Application
MEASURING APPARATUS, TEST APPARATUS, RECORDING MEDIUM, PROGRAM AND...
- Publication number 20090207897
- Publication date Aug 20, 2009
- Advantest Corporation
- TAKAHIRO YAMAGUCHI
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Test apparatus, clock generator and electronic device
- Publication number 20070098128
- Publication date May 3, 2007
- Masahiro Ishida
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Apparatus for and method of measuring clock skew
- Publication number 20070036256
- Publication date Feb 15, 2007
- Advantest Corporation
- Takahiro Yamaguchi
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Apparatus for measuring jitter and method of measuring jitter
- Publication number 20060268970
- Publication date Nov 30, 2006
- Advantest Corporation
- Kiyotaka Ichiyama
- G01 - MEASURING TESTING
Information Patent Application
Apparatus for measuring jitter and method of measuring jitter
- Publication number 20060251162
- Publication date Nov 9, 2006
- Advantest Corporation
- Takahiro Yamaguchi
- G01 - MEASURING TESTING
Information Patent Application
Jitter measurement apparatus, jitter measurement method, test appar...
- Publication number 20060182170
- Publication date Aug 17, 2006
- Advantest Corporation
- Kiyotaka Ichiyama
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Test apparatus and test method
- Publication number 20060184332
- Publication date Aug 17, 2006
- Advantest Corporation
- Masahiro Ishida
- G01 - MEASURING TESTING
Information Patent Application
Phase difference detecting apparatus
- Publication number 20060087346
- Publication date Apr 27, 2006
- Advantest Corporation
- Masahiro Ishida
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Jitter measuring apparatus, jitter measuring method and PLL circuit
- Publication number 20060018418
- Publication date Jan 26, 2006
- Advantest Corporation
- Kiyotaka Ichiyama
- G01 - MEASURING TESTING
Information Patent Application
Wideband signal analyzing apparatus, wideband period jitter analyzi...
- Publication number 20050273320
- Publication date Dec 8, 2005
- Takahiro Yamaguchi
- G01 - MEASURING TESTING
Information Patent Application
Measurement instrument and measurement method
- Publication number 20050267696
- Publication date Dec 1, 2005
- Takahiro Yamaguchi
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Apparatus for measuring jitter, method of measuring jitter and comp...
- Publication number 20050185708
- Publication date Aug 25, 2005
- Advantest Corporation
- Takahiro Yamaguchi
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Testing apparatus and testing method
- Publication number 20050149784
- Publication date Jul 7, 2005
- Masahiro Ishida
- G01 - MEASURING TESTING
Information Patent Application
Testing apparatus and testing method
- Publication number 20050129104
- Publication date Jun 16, 2005
- Advantest Corporation
- Masahiro Ishida
- G01 - MEASURING TESTING
Information Patent Application
Measuring apparatus and measuring method
- Publication number 20050031029
- Publication date Feb 10, 2005
- Takahiro Yamaguchi
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Characterization of radio frequency (RF) signals using wavelet-base...
- Publication number 20040117160
- Publication date Jun 17, 2004
- Mani Soma
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Jitter measurement apparatus and jitter measurement method
- Publication number 20040062301
- Publication date Apr 1, 2004
- Takahiro Yamaguchi
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Processing apparatus, processing method and position detecting device
- Publication number 20040027586
- Publication date Feb 12, 2004
- Masayoshi Ichikawa
- G01 - MEASURING TESTING
Information Patent Application
Electronic device and supporting member
- Publication number 20040016930
- Publication date Jan 29, 2004
- Minako Yoshida
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Measuring apparatus and measuring method
- Publication number 20030202573
- Publication date Oct 30, 2003
- Takahiro Yamaguchi
- G01 - MEASURING TESTING
Information Patent Application
Jitter estimating device and estimating method
- Publication number 20030125888
- Publication date Jul 3, 2003
- Takahiro Yamaguchi
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Clock skew measuring apparatus and method
- Publication number 20030094937
- Publication date May 22, 2003
- Mani Soma
- G01 - MEASURING TESTING
Information Patent Application
Probability estimating apparatus and method for peak-to-peak clock...
- Publication number 20030031284
- Publication date Feb 13, 2003
- Masahiro Ishida
- G01 - MEASURING TESTING
Information Patent Application
Apparatus for and method of measuring cross-correlation coefficient...
- Publication number 20030018442
- Publication date Jan 23, 2003
- Takahiro Yamaguchi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Apparatus for and method of measuring clock skew
- Publication number 20020176525
- Publication date Nov 28, 2002
- Takahiro Yamaguchi
- G01 - MEASURING TESTING
Information Patent Application
Apparatus for and method of measuring jitter
- Publication number 20020163958
- Publication date Nov 7, 2002
- Takahiro Yamaguchi
- G01 - MEASURING TESTING

Person

Patents Grantslast 30 patents

Jitter measurement apparatus, jitter measurement method, test appar...

Signal-to-noise ratio measurement for discrete waveform

Measuring apparatus and measuring method

Test apparatus, clock generator and electronic device

Jitter measuring apparatus, jitter measuring method and PLL circuit

Apparatus for measuring jitter and method of measuring jitter

Apparatus for measuring jitter and method of measuring jitter

Testing device for testing electronic device and testing method the...

Apparatus for and method of measuring clock skew

Characterization of radio frequency (RF) signals using wavelet-base...

Wideband signal analyzing apparatus, wideband period jitter analyzi...

Test apparatus and test method for testing a device under test

Measurement instrument and measurement method

Probability estimating apparatus and method for peak-to-peak clock...

Electronic device with integrally formed light emitting device and...

Apparatus for and method of measuring jitter

Processing apparatus, processing method and position detecting device

Testing apparatus and testing method

Apparatus for and method of measuring clock skew

Measuring apparatus and measuring method

Jitter estimating apparatus and estimating method

Apparatus for and method of measuring jitter

Charge-based frequency measurement bist

Jitter measuring device and method

Apparatus for and method of measuring a jitter

Clock skew measuring apparatus and method

Apparatus and method for measuring quality measure of phase noise w...

Apparatus for and method of measuring a jitter

Apparatus for and method of measuring a jitter

Jitter measurement apparatus and its method

Patents Applicationslast 30 patents

DATA PROCESSING APPARATUS, DATA PROCESSING SYSTEM, MEASUREMENT SYST...

MEASURING APPARATUS, TEST APPARATUS, RECORDING MEDIUM, PROGRAM AND...

Test apparatus, clock generator and electronic device

Apparatus for and method of measuring clock skew

Apparatus for measuring jitter and method of measuring jitter

Apparatus for measuring jitter and method of measuring jitter

Jitter measurement apparatus, jitter measurement method, test appar...

Test apparatus and test method

Phase difference detecting apparatus

Jitter measuring apparatus, jitter measuring method and PLL circuit

Wideband signal analyzing apparatus, wideband period jitter analyzi...

Measurement instrument and measurement method

Apparatus for measuring jitter, method of measuring jitter and comp...

Testing apparatus and testing method

Testing apparatus and testing method

Measuring apparatus and measuring method

Characterization of radio frequency (RF) signals using wavelet-base...

Jitter measurement apparatus and jitter measurement method

Processing apparatus, processing method and position detecting device

Electronic device and supporting member

Measuring apparatus and measuring method

Jitter estimating device and estimating method

Clock skew measuring apparatus and method

Probability estimating apparatus and method for peak-to-peak clock...

Apparatus for and method of measuring cross-correlation coefficient...

Apparatus for and method of measuring clock skew

Apparatus for and method of measuring jitter