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Manish Kumar Mittal
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Noida, IN
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last 30 patents
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Patent Grant
System and method for scan chain re-ordering
Patent number
8,839,061
Issue date
Sep 16, 2014
Freescale Semiconductor, Inc.
Puneet Dodeja
G01 - MEASURING TESTING
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last 30 patents
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Patent Application
SYSTEM AND METHOD FOR SCAN CHAIN RE-ORDERING
Publication number
20140223249
Publication date
Aug 7, 2014
Puneet Dodeja
G01 - MEASURING TESTING