Manish Sharma

Person

Gurgaon, IN

People

Patents Grantslast 30 patents

Information Patent Grant
TVF transition coverage with self-test and production-test time red...
- Patent number 12,146,911
- Issue date Nov 19, 2024
- STMICROELECTRONICS INTERNATIONAL N.V.
- Venkata Narayanan Srinivasan
- G01 - MEASURING TESTING
Information Patent Grant
Circuit and method for scan testing
- Patent number 11,714,131
- Issue date Aug 1, 2023
- STMICROELECTRONICS INTERNATIONAL N.V.
- Venkata Narayanan Srinivasan
- G01 - MEASURING TESTING
Information Patent Grant
Automatic test pattern generation circuitry in multi power domain s...
- Patent number 11,680,982
- Issue date Jun 20, 2023
- STMICROELECTRONICS INTERNATIONAL N.V.
- Venkata Narayanan Srinivasan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Combinatorial serial and parallel test access port selection in a J...
- Patent number 11,041,905
- Issue date Jun 22, 2021
- STMicroelectronics International N.V.
- Venkata Narayanan Srinivasan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Sequential test access port selection in a JTAG interface
- Patent number 10,890,619
- Issue date Jan 12, 2021
- STMicroelectronics International N.V.
- Venkata Narayanan Srinivasan
- G01 - MEASURING TESTING
Information Patent Grant
Using trusted platform module to build real time indicators of atta...
- Patent number 10,812,466
- Issue date Oct 20, 2020
- McAfee, LLC
- Balbir Singh
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Combinatorial serial and parallel test access port selection in a J...
- Patent number 10,495,690
- Issue date Dec 3, 2019
- STMicroelectronics International N.V.
- Venkata Narayanan Srinivasan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Sequential test access port selection in a JTAG interface
- Patent number 10,386,411
- Issue date Aug 20, 2019
- STMicroelectronics International N.V.
- Venkata Narayanan Srinivasan
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
TVF TRANSITION COVERAGE WITH SELF-TEST AND PRODUCTION-TEST TIME RED...
- Publication number 20240402249
- Publication date Dec 5, 2024
- STMicroelectronics International N.V.
- Venkata Narayanan Srinivasan
- G01 - MEASURING TESTING
Information Patent Application
AREA, COST, AND TIME-EFFECTIVE SCAN COVERAGE IMPROVEMENT
- Publication number 20240250668
- Publication date Jul 25, 2024
- STMicroelectronics International N.V.
- Venkata Narayanan Srinivasan
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
AUTOMATIC TEST PATTERN GENERATION CIRCUITRY IN MULTI POWER DOMAIN S...
- Publication number 20230128466
- Publication date Apr 27, 2023
- STMicroelectronics International N.V.
- Venkata Narayanan SRINIVASAN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
COMBINATORIAL SERIAL AND PARALLEL TEST ACCESS PORT SELECTION IN A J...
- Publication number 20200064405
- Publication date Feb 27, 2020
- STMicroelectronics International N.V.
- Venkata Narayanan SRINIVASAN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SEQUENTIAL TEST ACCESS PORT SELECTION IN A JTAG INTERFACE
- Publication number 20190331733
- Publication date Oct 31, 2019
- STMicroelectronics International N.V.
- Venkata Narayanan Srinivasan
- G01 - MEASURING TESTING
Information Patent Application
COMBINATORIAL SERIAL AND PARALLEL TEST ACCESS PORT SELECTION IN A J...
- Publication number 20190064270
- Publication date Feb 28, 2019
- STMicroelectronics International N.V.
- Venkata Narayanan Srinivasan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SEQUENTIAL TEST ACCESS PORT SELECTION IN A JTAG INTERFACE
- Publication number 20190064271
- Publication date Feb 28, 2019
- STMicroelectronics International N.V.
- Venkata Narayanan Srinivasan
- G01 - MEASURING TESTING
Information Patent Application
Using Trusted Platform Module To Build Real Time Indicators of Atta...
- Publication number 20160330193
- Publication date Nov 10, 2016
- McAfee, Inc.
- Balbir Singh
- H04 - ELECTRIC COMMUNICATION TECHNIQUE

Manish Sharma

Person

Patents Grantslast 30 patents

TVF transition coverage with self-test and production-test time red...

Circuit and method for scan testing

Automatic test pattern generation circuitry in multi power domain s...

Combinatorial serial and parallel test access port selection in a J...

Sequential test access port selection in a JTAG interface

Using trusted platform module to build real time indicators of atta...

Combinatorial serial and parallel test access port selection in a J...

Sequential test access port selection in a JTAG interface

Patents Applicationslast 30 patents

TVF TRANSITION COVERAGE WITH SELF-TEST AND PRODUCTION-TEST TIME RED...

AREA, COST, AND TIME-EFFECTIVE SCAN COVERAGE IMPROVEMENT

AUTOMATIC TEST PATTERN GENERATION CIRCUITRY IN MULTI POWER DOMAIN S...

COMBINATORIAL SERIAL AND PARALLEL TEST ACCESS PORT SELECTION IN A J...

SEQUENTIAL TEST ACCESS PORT SELECTION IN A JTAG INTERFACE

COMBINATORIAL SERIAL AND PARALLEL TEST ACCESS PORT SELECTION IN A J...

SEQUENTIAL TEST ACCESS PORT SELECTION IN A JTAG INTERFACE

Using Trusted Platform Module To Build Real Time Indicators of Atta...