Manjul Bhushan

Person

Hopewell Junction, NY, US

People

Patents Grantslast 30 patents

Information Patent Grant
Single level of metal test structure for differential timing and va...
- Patent number 9,194,909
- Issue date Nov 24, 2015
- International Business Machines Corporation
- Manjul Bhushan
- G01 - MEASURING TESTING
Information Patent Grant
Reducing performance degradation in backup semiconductor chips
- Patent number 9,110,777
- Issue date Aug 18, 2015
- International Business Machines Corporation
- Aditya Bansal
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Single level of metal test structure for differential timing and va...
- Patent number 9,075,109
- Issue date Jul 7, 2015
- International Business Machines Corporation
- Manjul Bhushan
- G01 - MEASURING TESTING
Information Patent Grant
Active 2-dimensional array structure for parallel testing
- Patent number 8,723,528
- Issue date May 13, 2014
- International Business Machines Corporation
- Mark B. Ketchen
- G01 - MEASURING TESTING
Information Patent Grant
Device-based random variability modeling in timing analysis
- Patent number 8,589,842
- Issue date Nov 19, 2013
- International Business Machines Corporation
- Manjul Bhushan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
High speed measurement of random variation/yield in integrated circ...
- Patent number 8,456,169
- Issue date Jun 4, 2013
- International Business Machines Corporation
- Manjul Bhushan
- G01 - MEASURING TESTING
Information Patent Grant
Measurement of partially depleted silicon-on-insulator CMOS circuit...
- Patent number 8,310,269
- Issue date Nov 13, 2012
- International Business Machines Corporation
- Manjul Bhushan
- G01 - MEASURING TESTING
Information Patent Grant
Acquisition of silicon-on-insulator switching history effects stati...
- Patent number 8,248,094
- Issue date Aug 21, 2012
- International Business Machines Corporation
- Manjul Bhushan
- G01 - MEASURING TESTING
Information Patent Grant
Single level of metal test structure for differential timing and va...
- Patent number 8,179,120
- Issue date May 15, 2012
- International Business Machines Corporation
- Manjul Bhushan
- G01 - MEASURING TESTING
Information Patent Grant
Methods and apparatus for determining a switching history time cons...
- Patent number 8,027,797
- Issue date Sep 27, 2011
- International Business Machines Corporation
- Manjul Bhushan
- G01 - MEASURING TESTING
Information Patent Grant
Methods and apparatus for inline variability measurement of integra...
- Patent number 7,595,654
- Issue date Sep 29, 2009
- International Business Machines Corporation
- Manjul Bhushan
- G01 - MEASURING TESTING
Information Patent Grant
Methods and apparatus for pulse generation used in characterizing e...
- Patent number 7,583,125
- Issue date Sep 1, 2009
- International Business Machines Corporation
- Manjul Bhushan
- G01 - MEASURING TESTING
Information Patent Grant
M1 testable addressable array for device parameter characterization
- Patent number 7,512,509
- Issue date Mar 31, 2009
- International Business Machines Corporation
- Manjul Bhushan
- G01 - MEASURING TESTING
Information Patent Grant
Methods and apparatus for inline measurement of switching delay his...
- Patent number 7,504,896
- Issue date Mar 17, 2009
- International Business Machines Corporation
- Manjul Bhushan
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Methods and apparatus for characterizing electronic fuses used to p...
- Patent number 7,504,875
- Issue date Mar 17, 2009
- International Business Machines Corporation
- Manjul Bhushan
- G01 - MEASURING TESTING
Information Patent Grant
Methods and apparatus for inline characterization of high speed ope...
- Patent number 7,355,902
- Issue date Apr 8, 2008
- International Business Machines Corporation
- Manjul Bhushan
- G11 - INFORMATION STORAGE
Information Patent Grant
Methods and apparatus for inline variability measurement of integra...
- Patent number 7,342,406
- Issue date Mar 11, 2008
- International Business Machines Corporation
- Manjul Bhushan
- G01 - MEASURING TESTING
Information Patent Grant
Methods and apparatus for characterizing electronic fuses used to p...
- Patent number 7,295,057
- Issue date Nov 13, 2007
- International Business Machines Corporation
- Manjul Bhushan
- G01 - MEASURING TESTING
Information Patent Grant
Methods and apparatus for ring oscillator based MOSFET gate capacit...
- Patent number 7,265,639
- Issue date Sep 4, 2007
- International Business Machines Corporation
- Manjul Bhushan
- G01 - MEASURING TESTING
Information Patent Grant
Methods and apparatus for measuring change in performance of ring o...
- Patent number 7,190,233
- Issue date Mar 13, 2007
- International Business Machines Corporation
- Manjul Bhushan
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for measuring transfer characteristics of a se...
- Patent number 7,176,695
- Issue date Feb 13, 2007
- International Business Machines Corporation
- Manjul Bhushan
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for measuring transfer characteristics of a se...
- Patent number 7,145,347
- Issue date Dec 5, 2006
- International Business Machines Corporation
- Manjul Bhushan
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for rapid inline measurement of parameter spre...
- Patent number 7,085,658
- Issue date Aug 1, 2006
- International Business Machines Corporation
- Manjul Bhushan
- G11 - INFORMATION STORAGE
Information Patent Grant
Method and apparatus for determining characteristics of MOS devices
- Patent number 7,069,525
- Issue date Jun 27, 2006
- International Business Machines Corporation
- Manjul Bhushan
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for characterizing a circuit with multiple inputs
- Patent number 6,960,926
- Issue date Nov 1, 2005
- International Business Machines Corporation
- Carl J. Anderson
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for characterizing switching history impact
- Patent number 6,798,261
- Issue date Sep 28, 2004
- International Business Machines Corporation
- Manjul Bhushan
- H03 - BASIC ELECTRONIC CIRCUITRY

Patents Applicationslast 30 patents

Information Patent Application
REDUCING PERFORMANCE DEGRADATION IN BACKUP SEMICONDUCTOR CHIPS
- Publication number 20130212414
- Publication date Aug 15, 2013
- International Business Machines Corporation
- Aditya Bansal
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ACTIVE 2-DIMENSIONAL ARRAY STRUCTURE FOR PARALLEL TESTING
- Publication number 20120286796
- Publication date Nov 15, 2012
- International Business Machines Corporation
- Mark B. Ketchen
- G01 - MEASURING TESTING
Information Patent Application
TEST STRUCTURE FOR PARALLEL TEST IMPLEMENTED WITH ONE METAL LAYER
- Publication number 20120256651
- Publication date Oct 11, 2012
- International Business Machines Corporation
- Manjul Bhushan
- G01 - MEASURING TESTING
Information Patent Application
SINGLE LEVEL OF METAL TEST STRUCTURE FOR DIFFERENTIAL TIMING AND VA...
- Publication number 20120166898
- Publication date Jun 28, 2012
- International Business Machines Corporation
- Manjul Bhushan
- G01 - MEASURING TESTING
Information Patent Application
SINGLE LEVEL OF METAL TEST STRUCTURE FOR DIFFERENTIAL TIMING AND VA...
- Publication number 20120161807
- Publication date Jun 28, 2012
- International Business Machines Corporation
- Manjul Bhushan
- G01 - MEASURING TESTING
Information Patent Application
HIGH SPEED MEASUREMENT OF RANDOM VARIATION/YIELD IN INTEGRATED CIRC...
- Publication number 20110169499
- Publication date Jul 14, 2011
- International Business Machines Corporation
- Manjul Bhushan
- G01 - MEASURING TESTING
Information Patent Application
SINGLE LEVEL OF METAL TEST STRUCTURE FOR DIFFERENTIAL TIMING AND VA...
- Publication number 20110043215
- Publication date Feb 24, 2011
- International Business Machines Corporation
- Manjul Bhushan
- G01 - MEASURING TESTING
Information Patent Application
MEASUREMENT OF PARTIALLY DEPLETED SILICON-ON-INSULATOR CMOS CIRCUIT...
- Publication number 20110043243
- Publication date Feb 24, 2011
- International Business Machines Corporation
- Manjul Bhushan
- G01 - MEASURING TESTING
Information Patent Application
ACQUISITION OF SILICON-ON-INSULATOR SWITCHING HISTORY EFFECTS STATI...
- Publication number 20110043242
- Publication date Feb 24, 2011
- International Business Machines Corporation
- Manjul Bhushan
- G01 - MEASURING TESTING
Information Patent Application
Methods and Apparatus for Determining a Switching History Time Cons...
- Publication number 20090271134
- Publication date Oct 29, 2009
- Manjul Bhushan
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
M1 Testable Addressable Array for Device Parameter Characterization
- Publication number 20080270064
- Publication date Oct 30, 2008
- Manjul Bhushan
- G01 - MEASURING TESTING
Information Patent Application
Methods and Apparatus for Inline Variability Measurement of Integra...
- Publication number 20080142848
- Publication date Jun 19, 2008
- International Business Machines Corporation
- Manjul Bhushan
- G01 - MEASURING TESTING
Information Patent Application
Methods and apparatus for inline measurement of switching delay his...
- Publication number 20080068099
- Publication date Mar 20, 2008
- Manjul Bhushan
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Methods and Apparatus for Characterizing Electronic Fuses Used to P...
- Publication number 20080048638
- Publication date Feb 28, 2008
- International Business Machines Corporation
- Manjul Bhushan
- G01 - MEASURING TESTING
Information Patent Application
Methods and Apparatus for Characterizing Electronic Fuses Used to P...
- Publication number 20080048761
- Publication date Feb 28, 2008
- International Business Machines Corporation
- Manjul Bhushan
- G01 - MEASURING TESTING
Information Patent Application
Methods and apparatus for inline characterization of high speed ope...
- Publication number 20070263476
- Publication date Nov 15, 2007
- International Business Machines Corporation
- Manjul Bhushan
- G11 - INFORMATION STORAGE
Information Patent Application
Methods and apparatus for inline variability measurement of integra...
- Publication number 20070132473
- Publication date Jun 14, 2007
- International Business Machines Corporation
- Manjul Bhushan
- G01 - MEASURING TESTING
Information Patent Application
Methods and apparatus for ring oscillator based mosfet gate capacit...
- Publication number 20070046383
- Publication date Mar 1, 2007
- International Business Machines Corporation
- Manjul Bhushan
- G01 - MEASURING TESTING
Information Patent Application
METHODS AND APPARATUS FOR MEASURING CHANGE IN PERFORMANCE OF RING O...
- Publication number 20070013452
- Publication date Jan 18, 2007
- International Business Machines Corporation
- Manjul Bhushan
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
METHOD AND APPARATUS FOR MEASURING TRANSFER CHARACTERISTICS OF A SE...
- Publication number 20060273803
- Publication date Dec 7, 2006
- International Business Machines Corporation
- Manjul Bhushan
- G01 - MEASURING TESTING
Information Patent Application
Methods and apparatus for characterizing electronic fuses used to p...
- Publication number 20060158239
- Publication date Jul 20, 2006
- International Business Machines Corporation
- Manjul Bhushan
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for rapid inline measurement of parameter spre...
- Publication number 20060100811
- Publication date May 11, 2006
- Manjul Bhushan
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for measuring transfer characteristics of a se...
- Publication number 20060044004
- Publication date Mar 2, 2006
- Manjul Bhushan
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for determining characteristics of MOS devices
- Publication number 20050012556
- Publication date Jan 20, 2005
- International Business Machines Corporation
- Manjul Bhushan
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for characterizing a circuit with multiple inputs
- Publication number 20030237029
- Publication date Dec 25, 2003
- International Business
- Carl J. Anderson
- G01 - MEASURING TESTING

Manjul Bhushan

Person

Patents Grantslast 30 patents

Single level of metal test structure for differential timing and va...

Reducing performance degradation in backup semiconductor chips

Single level of metal test structure for differential timing and va...

Active 2-dimensional array structure for parallel testing

Device-based random variability modeling in timing analysis

High speed measurement of random variation/yield in integrated circ...

Measurement of partially depleted silicon-on-insulator CMOS circuit...

Acquisition of silicon-on-insulator switching history effects stati...

Single level of metal test structure for differential timing and va...

Methods and apparatus for determining a switching history time cons...

Methods and apparatus for inline variability measurement of integra...

Methods and apparatus for pulse generation used in characterizing e...

M1 testable addressable array for device parameter characterization

Methods and apparatus for inline measurement of switching delay his...

Methods and apparatus for characterizing electronic fuses used to p...

Methods and apparatus for inline characterization of high speed ope...

Methods and apparatus for inline variability measurement of integra...

Methods and apparatus for characterizing electronic fuses used to p...

Methods and apparatus for ring oscillator based MOSFET gate capacit...

Methods and apparatus for measuring change in performance of ring o...

Method and apparatus for measuring transfer characteristics of a se...

Method and apparatus for measuring transfer characteristics of a se...

Method and apparatus for rapid inline measurement of parameter spre...

Method and apparatus for determining characteristics of MOS devices

Method and apparatus for characterizing a circuit with multiple inputs

Method and apparatus for characterizing switching history impact

Patents Applicationslast 30 patents

REDUCING PERFORMANCE DEGRADATION IN BACKUP SEMICONDUCTOR CHIPS

ACTIVE 2-DIMENSIONAL ARRAY STRUCTURE FOR PARALLEL TESTING

TEST STRUCTURE FOR PARALLEL TEST IMPLEMENTED WITH ONE METAL LAYER

SINGLE LEVEL OF METAL TEST STRUCTURE FOR DIFFERENTIAL TIMING AND VA...

SINGLE LEVEL OF METAL TEST STRUCTURE FOR DIFFERENTIAL TIMING AND VA...

HIGH SPEED MEASUREMENT OF RANDOM VARIATION/YIELD IN INTEGRATED CIRC...

SINGLE LEVEL OF METAL TEST STRUCTURE FOR DIFFERENTIAL TIMING AND VA...

MEASUREMENT OF PARTIALLY DEPLETED SILICON-ON-INSULATOR CMOS CIRCUIT...

ACQUISITION OF SILICON-ON-INSULATOR SWITCHING HISTORY EFFECTS STATI...

Methods and Apparatus for Determining a Switching History Time Cons...

M1 Testable Addressable Array for Device Parameter Characterization

Methods and Apparatus for Inline Variability Measurement of Integra...

Methods and apparatus for inline measurement of switching delay his...

Methods and Apparatus for Characterizing Electronic Fuses Used to P...

Methods and Apparatus for Characterizing Electronic Fuses Used to P...

Methods and apparatus for inline characterization of high speed ope...

Methods and apparatus for inline variability measurement of integra...

Methods and apparatus for ring oscillator based mosfet gate capacit...

METHODS AND APPARATUS FOR MEASURING CHANGE IN PERFORMANCE OF RING O...

METHOD AND APPARATUS FOR MEASURING TRANSFER CHARACTERISTICS OF A SE...

Methods and apparatus for characterizing electronic fuses used to p...

Method and apparatus for rapid inline measurement of parameter spre...

Method and apparatus for measuring transfer characteristics of a se...

Method and apparatus for determining characteristics of MOS devices

Method and apparatus for characterizing a circuit with multiple inputs