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Manoj Sachdev
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Ontario, CA
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last 30 patents
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Patent Grant
Test for weak SRAM cells
Patent number
7,200,057
Issue date
Apr 3, 2007
NXP B.V.
Jose De Jesus Pineda De Gyvez
G11 - INFORMATION STORAGE
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Patent Grant
Low frequency testing, leakage control, and burn-in control for hig...
Patent number
6,765,414
Issue date
Jul 20, 2004
Intel Corporation
Ali Keshavarzi
G01 - MEASURING TESTING
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last 30 patents
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Patent Application
Test for weak sram cells
Publication number
20060187724
Publication date
Aug 24, 2006
Koninklijke Philips Electronics N.V.
Jose De Jesus Pineda De Gyvez
G11 - INFORMATION STORAGE
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Patent Application
Low frequency testing, leakage control, and burn-in control for hig...
Publication number
20040051558
Publication date
Mar 18, 2004
Ali Keshavarzi
G01 - MEASURING TESTING