Manuel A. Quevedo-Lopez

Person

Denton, TX, US

People

Patents Grantslast 30 patents

Information Patent Grant
Radiation detectors having perovskite films
- Patent number 12,298,452
- Issue date May 13, 2025
- Board of Regents, The University of Texas System
- Manuel Quevedo Lopez
- G01 - MEASURING TESTING
Information Patent Grant
Method for the integration of monolithic thin film radiation detect...
- Patent number 11,296,140
- Issue date Apr 5, 2022
- Board of Regents, The University of Texas System
- Jesus I. Mejia-Silva
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Formation of metal gate electrode using rare earth alloy incorporat...
- Patent number 8,816,446
- Issue date Aug 26, 2014
- Texas Instruments Incorporated
- Hiroaki Niimi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Formation of metal gate electrode using rare earth alloy incorporat...
- Patent number 8,058,122
- Issue date Nov 15, 2011
- Texas Instruments Incorporated
- Hiroaki Niimi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Integration of high-k metal gate stack into direct silicon bonding...
- Patent number 7,943,479
- Issue date May 17, 2011
- Texas Instruments Incorporated
- Angelo Pinto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of forming an isolation structure by performing multiple hig...
- Patent number 7,799,632
- Issue date Sep 21, 2010
- Texas Instruments Incorporated
- Jin Zhao
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods and systems to mitigate etch stop clipping for shallow tren...
- Patent number 7,625,807
- Issue date Dec 1, 2009
- Texas Instruments Incorporated
- Manuel A. Quevedo-Lopez
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods and systems to mitigate etch stop clipping for shallow tren...
- Patent number 7,199,021
- Issue date Apr 3, 2007
- Texas Instruments Incorporated
- Manuel Quevedo-Lopez
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Top surface roughness reduction of high-k dielectric materials usin...
- Patent number 7,115,530
- Issue date Oct 3, 2006
- Texas Instruments Incorporated
- Manuel A. Quevedo-Lopez
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Method to engineer the inverse narrow width effect (INWE) in CMOS t...
- Patent number 7,045,436
- Issue date May 16, 2006
- Texas Instruments Incorporated
- Amitava Chatterjee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for removing contaminants on a substrate
- Patent number 6,933,235
- Issue date Aug 23, 2005
- The Regents of the University of North Texas
- Manuel A. Quevedo-Lopez
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
High-k gate dielectric with uniform nitrogen profile and methods fo...
- Patent number 6,809,370
- Issue date Oct 26, 2004
- Texas Instruments Incorporated
- Luigi Colombo
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
METHODS OF DEPOSITING FILMS WITH THE SAME STOICHIOMETRIC FEATURES A...
- Publication number 20230349068
- Publication date Nov 2, 2023
- Board of Regents, The University of Texas System
- Manuel Quevedo Lopez
- C30 - CRYSTAL GROWTH
Information Patent Application
RADIATION DETECTORS HAVING PEROVSKITE FILMS
- Publication number 20230314636
- Publication date Oct 5, 2023
- Board of Regents, The University of Texas System
- Manuel Quevedo Lopez
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Neutron Detectors and Methods of Fabricating the Same Using Boron a...
- Publication number 20230065803
- Publication date Mar 2, 2023
- Board of Regents, The University of Texas System
- Siddartha Srinivasan Nandagopala Krishnan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
RADIATION DETECTOR
- Publication number 20200292719
- Publication date Sep 17, 2020
- Board of Regents, The University of Texas System
- Manuel Quevedo-Lopez
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR THE INTEGRATION OF MONOLITHIC THIN FLIM RADIATION DETECT...
- Publication number 20200127038
- Publication date Apr 23, 2020
- Board of Regents, The University of Texas System
- Jesus I. Mejia-Silva
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
FORMATION OF METAL GATE ELECTRODE USING RARE EARTH ALLOY INCORPORAT...
- Publication number 20120012941
- Publication date Jan 19, 2012
- TEXAS INSTRUMENTS INCORPORATED
- Hiroaki Niimi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INTEGRATION OF HIGH-K METAL-GATE STACK INTO DIRECT SILICON BONDING...
- Publication number 20100047993
- Publication date Feb 25, 2010
- TEXAS INSTRUMENTS INCORPORATED
- Angelo Pinto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
FORMATION OF METAL GATE ELECTRODE USING RARE EARTH ALLOY INCORPORAT...
- Publication number 20090166747
- Publication date Jul 2, 2009
- TEXAS INSTRUMENTS INCORPORATED
- Hiroaki Niimi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
THERMAL ANNEAL METHOD FOR A HIGH-K DIELECTRIC
- Publication number 20080242114
- Publication date Oct 2, 2008
- TEXAS INSTRUMENTS INCORPORATED
- Manuel Quevedo-Lopez
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PLASMA NITRIDED GATE OXIDE, HIGH-K METAL GATE BASED CMOS DEVICE
- Publication number 20080237604
- Publication date Oct 2, 2008
- Husam Niman Alshareef
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Shallow trench isolation devices and methods
- Publication number 20080157264
- Publication date Jul 3, 2008
- Texas Instruments Inc.
- Jin Zhao
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Methods and systems to mitigate etch stop clipping for shallow tren...
- Publication number 20070134886
- Publication date Jun 14, 2007
- TEXAS INSTRUMENTS INCORPORATED
- Manuel Quevedo-Lopez
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method to test shallow trench isolation fill capability
- Publication number 20060284173
- Publication date Dec 21, 2006
- TEXAS INSTRUMENTS INCORPORATED
- Manuel A. Quevedo-Lopez
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Top surface roughness reduction of high-k dielectric materials usin...
- Publication number 20060121744
- Publication date Jun 8, 2006
- Manuel A. Quevedo-Lopez
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
Method to engineer the inverse narrow width effect (INWE) in CMOS t...
- Publication number 20060024910
- Publication date Feb 2, 2006
- Amitava Chatterjee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Methods and systems to mitigate etch stop clipping for shallow tren...
- Publication number 20050282351
- Publication date Dec 22, 2005
- Manuel Quevedo-Lopez
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Top surface roughness reduction of high-k dielectric materials usin...
- Publication number 20050124109
- Publication date Jun 9, 2005
- TEXAS INSTRUMENTS INCORPORATED
- Manuel A. Quevedo-Lopez
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
Method for removing contaminants on a substrate
- Publication number 20040102009
- Publication date May 27, 2004
- REGENTS OF THE UNIVERSITY OF NORTH TEXAS
- Manuel A. Quevedo-Lopez
- H01 - BASIC ELECTRIC ELEMENTS

Manuel A. Quevedo-Lopez

Person

Patents Grantslast 30 patents

Radiation detectors having perovskite films

Method for the integration of monolithic thin film radiation detect...

Formation of metal gate electrode using rare earth alloy incorporat...

Formation of metal gate electrode using rare earth alloy incorporat...

Integration of high-k metal gate stack into direct silicon bonding...

Method of forming an isolation structure by performing multiple hig...

Methods and systems to mitigate etch stop clipping for shallow tren...

Methods and systems to mitigate etch stop clipping for shallow tren...

Top surface roughness reduction of high-k dielectric materials usin...

Method to engineer the inverse narrow width effect (INWE) in CMOS t...

Method for removing contaminants on a substrate

High-k gate dielectric with uniform nitrogen profile and methods fo...

Patents Applicationslast 30 patents

METHODS OF DEPOSITING FILMS WITH THE SAME STOICHIOMETRIC FEATURES A...

RADIATION DETECTORS HAVING PEROVSKITE FILMS

Neutron Detectors and Methods of Fabricating the Same Using Boron a...

RADIATION DETECTOR

METHOD FOR THE INTEGRATION OF MONOLITHIC THIN FLIM RADIATION DETECT...

FORMATION OF METAL GATE ELECTRODE USING RARE EARTH ALLOY INCORPORAT...

INTEGRATION OF HIGH-K METAL-GATE STACK INTO DIRECT SILICON BONDING...

FORMATION OF METAL GATE ELECTRODE USING RARE EARTH ALLOY INCORPORAT...

THERMAL ANNEAL METHOD FOR A HIGH-K DIELECTRIC

PLASMA NITRIDED GATE OXIDE, HIGH-K METAL GATE BASED CMOS DEVICE

Shallow trench isolation devices and methods

Methods and systems to mitigate etch stop clipping for shallow tren...

Method to test shallow trench isolation fill capability

Top surface roughness reduction of high-k dielectric materials usin...

Method to engineer the inverse narrow width effect (INWE) in CMOS t...

Methods and systems to mitigate etch stop clipping for shallow tren...

Top surface roughness reduction of high-k dielectric materials usin...

Method for removing contaminants on a substrate