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Manuel Petermann
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Rosenheim, DE
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last 30 patents
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Patent Grant
Contact spring for a testing base for the high current testing of a...
Patent number
9,671,428
Issue date
Jun 6, 2017
Multitest Elektronische Systeme GmbH
Gerhard Gschwendtberger
G01 - MEASURING TESTING
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Patent Grant
Test apparatus for the testing of electronic components
Patent number
7,741,861
Issue date
Jun 22, 2010
Multitest Elektronische Systeme GmbH
Maximilian Schaule
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
CONTACT DEVICE AND A METHOD OF TESTING A SINGULATED ELECTRONIC COMP...
Publication number
20180172760
Publication date
Jun 21, 2018
Multitest elektronische Systeme GmbH
Volker Leikermoser
G01 - MEASURING TESTING
Information
Patent Application
CONTACT TIP AND CONTACT ELEMENT AND METHOD OF PRODUCING THE SAME
Publication number
20150192612
Publication date
Jul 9, 2015
Multitest elektronische Systeme GmbH
Manuel PETERMANN
G01 - MEASURING TESTING
Information
Patent Application
CONTACT SPRING FOR A TESTING BASE FOR THE HIGH CURRENT TESTING OF A...
Publication number
20140111237
Publication date
Apr 24, 2014
Gerhard GSCHWENDTBERGER
G01 - MEASURING TESTING
Information
Patent Application
Test Apparatus for the Testing of Electronic Components
Publication number
20080231296
Publication date
Sep 25, 2008
Multitest elektronische Systeme GmbH
Maximilian Schaule
G01 - MEASURING TESTING