Manuschai Chainok

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Muangchacherngsao Chacherngsao, TH

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Patents Grantslast 30 patents

Information Patent Grant
Method and apparatus for semiconductor testing at low temperature
- Patent number 9,224,659
- Issue date Dec 29, 2015
- Microchip Technology Incorporated
- Santi Butsoongnoen
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SYSTEM AND METHODS FOR PHYSICAL IDENTIFICATION OF MANUFACTURED PROD...
- Publication number 20250209418
- Publication date Jun 26, 2025
- MICROCHIP TECHNOLOGY INCORPORATED
- Roger Winkles
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method and Apparatus for Semiconductor Testing at Low Temperature
- Publication number 20140273307
- Publication date Sep 18, 2014
- Santi Butsoongnoen
- G01 - MEASURING TESTING