Mao-I Ting

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Hsinchu, TW

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Patents Grantslast 30 patents

Information Patent Grant
Critical dimension statistical process control in semiconductor fab...
- Patent number 6,799,152
- Issue date Sep 28, 2004
- Macronix International Co., Ltd.
- Chih-Ping Chen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Bubble detection system for detecting bubbles in photoresist tube
- Patent number 6,726,774
- Issue date Apr 27, 2004
- Macronix International Co., Ltd.
- Jia-Hau Tzeng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
True defect monitoring through repeating defect deletion
- Patent number 6,684,164
- Issue date Jan 27, 2004
- Macronix International Co., Ltd.
- Kung-Yi Chen
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
Method for defining a dummy pattern around an alignment mark on a w...
- Publication number 20040033689
- Publication date Feb 19, 2004
- Lien-Che Ho
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Bubble detection system for detecting bubbles in photoresist tube
- Publication number 20040011285
- Publication date Jan 22, 2004
- Jia-Hau Tzeng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Bond pad and process for fabricating the same
- Publication number 20030166334
- Publication date Sep 4, 2003
- Ming-Yu Lin
- H01 - BASIC ELECTRIC ELEMENTS