Mao-Yuan Shih

Person

  • Hsin-Chu City, TW

Patents Grantslast 30 patents

Patents Applicationslast 30 patents

  • Information Patent Application

    Method for whole field thin film stress evaluation

    • Publication number 20070017296
    • Publication date Jan 25, 2007
    • Instrument Technology Research Center, National Applied Research Laboratories
    • Chi Hung Huang
    • G01 - MEASURING TESTING