MAOHUA REN

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Shamen City, CN

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Patents Grantslast 30 patents

Information Patent Grant
Reticle thermal expansion calibration method capable of improving s...
- Patent number 12,216,072
- Issue date Feb 4, 2025
- United Semiconductor (Xiamen) Co., Ltd.
- Maohua Ren
- G01 - MEASURING TESTING
Information Patent Grant
Lithography film stack and lithography method
- Patent number 12,204,247
- Issue date Jan 21, 2025
- United Semiconductor (Xiamen) Co., Ltd.
- Ching-Shu Lo
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method for aligning to a pattern on a wafer
- Patent number 11,692,946
- Issue date Jul 4, 2023
- United Semiconductor (Xiamen) Co., Ltd.
- Dian Han Liu
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Reticle Thermal Expansion Calibration Method Capable of Improving S...
- Publication number 20240337613
- Publication date Oct 10, 2024
- United Semiconductor (Xiamen) Co., Ltd.
- MAOHUA REN
- G01 - MEASURING TESTING
Information Patent Application
LITHOGRAPHY FILM STACK AND LITHOGRAPHY METHOD
- Publication number 20240201598
- Publication date Jun 20, 2024
- United Semiconductor (Xiamen) Co., Ltd.
- Ching-Shu Lo
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
METHOD FOR ALIGNING TO A PATTERN ON A WAFER
- Publication number 20230288346
- Publication date Sep 14, 2023
- United Semiconductor (Xiamen) Co., Ltd.
- Dian Han Liu
- G01 - MEASURING TESTING
Information Patent Application
Reticle Thermal Expansion Calibration Method Capable of Improving S...
- Publication number 20230030500
- Publication date Feb 2, 2023
- United Semiconductor (Xiamen) Co., Ltd.
- MAOHUA REN
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR ALIGNING TO A PATTERN ON A WAFER
- Publication number 20220299448
- Publication date Sep 22, 2022
- United Semiconductor (Xiamen) Co., Ltd.
- Dian Han Liu
- H01 - BASIC ELECTRIC ELEMENTS