Marc Battyani

Person

Arlington, MA, US

People

Patents Grantslast 30 patents

Information Patent Grant
X-ray analytical instrument with improved control of detector cooli...
- Patent number 10,267,925
- Issue date Apr 23, 2019
- Olympus Scientific Solutions Americas Inc.
- Marc Battyani
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for X-ray detection system gain calibration us...
- Patent number 10,267,932
- Issue date Apr 23, 2019
- Olympus Scientific Solutions Americas Inc.
- Marc Battyani
- G01 - MEASURING TESTING
Information Patent Grant
Technique for sub-microsecond latency measurement across a bus
- Patent number 10,168,730
- Issue date Jan 1, 2019
- NovaSparks. S.A.
- Marc Battyani
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
X-ray analytical instrument with improved control of detector cooli...
- Patent number 10,094,936
- Issue date Oct 9, 2018
- Olympus Scientific Solutions Americas Inc.
- Marc Battyani
- G01 - MEASURING TESTING
Information Patent Grant
FPGA matrix architecture
- Patent number 9,904,931
- Issue date Feb 27, 2018
- NovaSparks, Inc.
- Marc Battyani
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
FPGA matrix architecture
- Patent number 9,443,269
- Issue date Sep 13, 2016
- NovaSparks, Inc.
- Marc Battyani
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
X-RAY ANALYTICAL INSTRUMENT WITH IMPROVED CONTROL OF DETECTOR COOLI...
- Publication number 20190004184
- Publication date Jan 3, 2019
- Olympus Scientific Solutions Americas Inc.
- Marc Battyani
- G01 - MEASURING TESTING
Information Patent Application
XRF ANALYZER WITH IMPROVED RESOLUTION BY USING MICRO-RESET
- Publication number 20170276803
- Publication date Sep 28, 2017
- Olympus Scientific Solutions Americas Inc.
- Marc Battyani
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR X-RAY DETECTION SYSTEM GAIN CALIBRATION US...
- Publication number 20170227661
- Publication date Aug 10, 2017
- Olympus Scientific Solutions Americas Inc.
- Marc Battyani
- G01 - MEASURING TESTING
Information Patent Application
X-RAY ANALYTICAL INSTRUMENT WITH IMPROVED CONTROL OF DETECTOR COOLI...
- Publication number 20170123075
- Publication date May 4, 2017
- Olympus Scientific Solutions Americas Inc.
- Marc Battyani
- G01 - MEASURING TESTING
Information Patent Application
FPGA MATRIX ARCHITECTURE
- Publication number 20160379227
- Publication date Dec 29, 2016
- NovaSparks, Inc.
- Marc Battyani
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Technique For Sub-Microsecond Latency Measurement Across A Bus
- Publication number 20140258766
- Publication date Sep 11, 2014
- NovaSparks. S.A.
- Marc Battyani
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
FPGA MATRIX ARCHITECTURE
- Publication number 20130226764
- Publication date Aug 29, 2013
- Marc Battyani
- G06 - COMPUTING CALCULATING COUNTING

Marc Battyani

Person

Patents Grantslast 30 patents

X-ray analytical instrument with improved control of detector cooli...

Method and apparatus for X-ray detection system gain calibration us...

Technique for sub-microsecond latency measurement across a bus

X-ray analytical instrument with improved control of detector cooli...

FPGA matrix architecture

FPGA matrix architecture

Patents Applicationslast 30 patents

X-RAY ANALYTICAL INSTRUMENT WITH IMPROVED CONTROL OF DETECTOR COOLI...

XRF ANALYZER WITH IMPROVED RESOLUTION BY USING MICRO-RESET

METHOD AND APPARATUS FOR X-RAY DETECTION SYSTEM GAIN CALIBRATION US...

X-RAY ANALYTICAL INSTRUMENT WITH IMPROVED CONTROL OF DETECTOR COOLI...

FPGA MATRIX ARCHITECTURE

Technique For Sub-Microsecond Latency Measurement Across A Bus

FPGA MATRIX ARCHITECTURE