Marc FAUCHER

Person

LESQUIN, FR

People

Patents Grantslast 30 patents

Information Patent Grant
Micromechanical sensor with optical transduction
- Patent number 11,156,634
- Issue date Oct 26, 2021
- VMICRO
- Benjamin Walter
- G01 - MEASURING TESTING
Information Patent Grant
Prestrained vibrating accelerometer
- Patent number 11,099,205
- Issue date Aug 24, 2021
- Centre National de la Recherche Scientifique
- Marc Faucher
- G01 - MEASURING TESTING
Information Patent Grant
Compact probe for atomic-force microscopy and atomic-force microsco...
- Patent number 10,527,645
- Issue date Jan 7, 2020
- VMICRO
- Benjamin Walter
- G01 - MEASURING TESTING
Information Patent Grant
Modulation device comprising a nanodiode
- Patent number 10,340,371
- Issue date Jul 2, 2019
- Centre National de la Recherche Scientifique
- Christophe Pierre Paul Gaquiere
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Miniaturized and compact probe for atomic force microscopy
- Patent number 10,302,673
- Issue date May 28, 2019
- VMICRO
- Benjamin Walter
- G01 - MEASURING TESTING
Information Patent Grant
Microelectromechanical device and system with low-impedance resisti...
- Patent number 9,815,686
- Issue date Nov 14, 2017
- VMICRO
- Benjamin Walter
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Carbon nanotube growth method
- Patent number 8,481,163
- Issue date Jul 9, 2013
- Centre National de la Recherche Scientifique
- Anne-Marie Bonnot
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Atomic force microscopy probe
- Patent number 8,091,143
- Issue date Jan 3, 2012
- Centre National de la Recherche Scientifique
- Marc Faucher
- B82 - NANO-TECHNOLOGY

Patents Applicationslast 30 patents

Information Patent Application
MICROMECHANICAL SENSOR WITH OPTICAL TRANSDUCTION
- Publication number 20210293850
- Publication date Sep 23, 2021
- VMICRO
- Benjamin WALTER
- G01 - MEASURING TESTING
Information Patent Application
PRESTRAINED VIBRATING ACCELEROMETER
- Publication number 20200319227
- Publication date Oct 8, 2020
- Centre National de la Recherche Scientifique
- Marc FAUCHER
- G01 - MEASURING TESTING
Information Patent Application
COMPACT PROBE FOR ATOMIC-FORCE MICROSCOPY AND ATOMIC-FORCE MICROSCO...
- Publication number 20180203037
- Publication date Jul 19, 2018
- CENTRE NATIONAL DE LA RECHERCHE SCIENTIFIQUE
- Benjamin WALTER
- G01 - MEASURING TESTING
Information Patent Application
Miniaturized and compact probe for atomic force microscopy
- Publication number 20180113149
- Publication date Apr 26, 2018
- Vmicro
- Benjamin WALTER
- G01 - MEASURING TESTING
Information Patent Application
MODULATION DEVICE COMPRISING A NANODIODE
- Publication number 20170352748
- Publication date Dec 7, 2017
- Centre National de la Recherche Scientifique
- Christophe Pierre Paul GAQUIERE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MICROELECTROMECHANICAL DEVICE AND SYSTEM WITH LOW-IMPEDANCE RESISTI...
- Publication number 20170113918
- Publication date Apr 27, 2017
- Vmicro
- Benjamin WALTER
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
ATOMIC FORCE MICROSCOPY PROBE
- Publication number 20100205698
- Publication date Aug 12, 2010
- Centre National de la Recherche Scientifique
- Marc Faucher
- G01 - MEASURING TESTING

Marc FAUCHER

Person

Patents Grantslast 30 patents

Micromechanical sensor with optical transduction

Prestrained vibrating accelerometer

Compact probe for atomic-force microscopy and atomic-force microsco...

Modulation device comprising a nanodiode

Miniaturized and compact probe for atomic force microscopy

Microelectromechanical device and system with low-impedance resisti...

Carbon nanotube growth method

Atomic force microscopy probe

Patents Applicationslast 30 patents

MICROMECHANICAL SENSOR WITH OPTICAL TRANSDUCTION

PRESTRAINED VIBRATING ACCELEROMETER

COMPACT PROBE FOR ATOMIC-FORCE MICROSCOPY AND ATOMIC-FORCE MICROSCO...

Miniaturized and compact probe for atomic force microscopy

MODULATION DEVICE COMPRISING A NANODIODE

MICROELECTROMECHANICAL DEVICE AND SYSTEM WITH LOW-IMPEDANCE RESISTI...

ATOMIC FORCE MICROSCOPY PROBE