Marc GONIN

Person

Thun, CH

People

Patents Grantslast 30 patents

Information Patent Grant
Ion molecule reactor and setup for analyzing complex mixtures
- Patent number 11,908,673
- Issue date Feb 20, 2024
- Tofwerk AG
- Felipe Lopez-Hilfiker
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Autosampler
- Patent number 11,227,755
- Issue date Jan 18, 2022
- Tofwerk AG
- Marc Gonin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus and method for analysing a chemical composition of aeroso...
- Patent number 10,811,240
- Issue date Oct 20, 2020
- Tofwerk AG
- Felipe Lopez-Hilfiker
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and an apparatus for determining a spectrum
- Patent number 10,444,186
- Issue date Oct 15, 2019
- Tofwerk AG
- Marc Gonin
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for mass spectrometry
- Patent number 10,424,470
- Issue date Sep 24, 2019
- Tofwerk AG
- Christian Tanner
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Device for mass spectrometry
- Patent number 10,141,170
- Issue date Nov 27, 2018
- Tofwerk AG
- Marc Gonin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Compact aerosol time-of-flight mass spectrometer
- Patent number 8,648,294
- Issue date Feb 11, 2014
- The Regents of the University of California
- Kimberly A. Prather
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Fast time-of-flight mass spectrometer with improved data acquisitio...
- Patent number 8,492,710
- Issue date Jul 23, 2013
- Ionwerks, Inc.
- Katrin Fuhrer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion guide chamber
- Patent number 7,935,922
- Issue date May 3, 2011
- Tofwerk AG
- Marc Gonin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Fast time-of-flight mass spectrometer with improved dynamic range
- Patent number 7,800,054
- Issue date Sep 21, 2010
- Ionwerks, Inc.
- Katrin Fuhrer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Fast time-of-flight mass spectrometer with improved data acquisitio...
- Patent number 7,365,313
- Issue date Apr 29, 2008
- Ionwerks
- Katrin Fuhrer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multi-anode detector with increased dynamic range for time-of-fligh...
- Patent number 7,291,834
- Issue date Nov 6, 2007
- Ionwerks, Inc.
- Marc Gonin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion mobility spectrometer
- Patent number 7,164,122
- Issue date Jan 16, 2007
- Ionwerks, Inc.
- Katrin Fuhrer
- G01 - MEASURING TESTING
Information Patent Grant
Multi-anode detector with increased dynamic range for time-of-fligh...
- Patent number 7,145,134
- Issue date Dec 5, 2006
- Ionwerks, Inc.
- Marc Gonin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Fast time-of-flight mass spectrometer with improved data acquisitio...
- Patent number 7,084,393
- Issue date Aug 1, 2006
- Ionwerks, Inc.
- Katrin Fuhrer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Time-of-flight mass spectrometer for monitoring of fast processes
- Patent number 7,084,395
- Issue date Aug 1, 2006
- Ionwerks, Inc.
- Katrin Fuhrer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multi-anode detector with increased dynamic range for time-of-fligh...
- Patent number 7,060,973
- Issue date Jun 13, 2006
- Ionwerks, Inc.
- Marc Gonin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Time-of-flight mass spectrometer for monitoring of fast processes
- Patent number 7,019,286
- Issue date Mar 28, 2006
- Ionwerks, Inc.
- Katrin Fuhrer
- G01 - MEASURING TESTING
Information Patent Grant
Multi-anode detector with increased dynamic range for time-of-fligh...
- Patent number 6,909,090
- Issue date Jun 21, 2005
- Ionwerks
- Marc Gonin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electrostatic ion trap mass spectrometers
- Patent number 6,888,130
- Issue date May 3, 2005
- Marc Gonin
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
METHOD AND APPARATUS FOR DETECTING ONE OR MORE LEAKS IN A BATTERY E...
- Publication number 20240387883
- Publication date Nov 21, 2024
- TOFWERK AG
- Marc Gonin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ION MOLECULE REACTOR AND SETUP FOR ANALYZING COMPLEX MIXTURES
- Publication number 20240194470
- Publication date Jun 13, 2024
- TOFWERK AG
- Felipe LOPEZ-HILFIKER
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR MASS ANALYSING A SAMPLE
- Publication number 20220334092
- Publication date Oct 20, 2022
- TOFWERK AG
- Sonja KLEE
- G01 - MEASURING TESTING
Information Patent Application
AUTOSAMPLER
- Publication number 20210066058
- Publication date Mar 4, 2021
- TOFWERK AG
- Marc GONIN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ION MOLECULE REACTOR AND SETUP FOR ANALYZING COMPLEX MIXTURES
- Publication number 20200243317
- Publication date Jul 30, 2020
- TOFWERK AG
- Felipe LOPEZ-HILFIKER
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD FOR ANALYSING A CHEMICAL COMPOSITION OF AEROSO...
- Publication number 20190237316
- Publication date Aug 1, 2019
- TOFWERK AG
- Felipe LOPEZ-HILFIKER
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD FOR MASS SPECTROMETRY
- Publication number 20180254176
- Publication date Sep 6, 2018
- TOFWERK AG
- Christian TANNER
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
METHOD AND AN APPARATUS FOR DETERMINING A SPECTRUM
- Publication number 20180100830
- Publication date Apr 12, 2018
- TOFWERK AG
- Marc GONIN
- G01 - MEASURING TESTING
Information Patent Application
DEVICE FOR MASS SPECTROMETRY
- Publication number 20170110305
- Publication date Apr 20, 2017
- TOFWERK AG
- Marc GONIN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Pulsed Mass Calibration in Time-of-Flight Mass Spectrometry
- Publication number 20150008310
- Publication date Jan 8, 2015
- ZOEX CORPORATION
- Edward B. LEDFORD
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
FAST TIME-OF-FLIGHT MASS SPECTROMETER WITH IMPROVED DATA ACQUISITIO...
- Publication number 20110049355
- Publication date Mar 3, 2011
- Ionwerks, Inc.
- Katrin Fuhrer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
FAST TIME-OF-FLIGHT MASS SPECTROMETER WITH IMPROVED DYNAMIC RANGE
- Publication number 20090008545
- Publication date Jan 8, 2009
- Ionwerks, Inc.
- Katrin Fuhrer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ION GUIDE CHAMBER
- Publication number 20080217528
- Publication date Sep 11, 2008
- TOFWERK AG
- Marc Gonin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
APPARATUS FOR MASS ANALYSIS OF IONS
- Publication number 20080149825
- Publication date Jun 26, 2008
- TOFWERK AG
- Viatcheslav Ivanovich KOZLOVSKI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Multi-anode detector with increased dynamic range for time-of-fligh...
- Publication number 20070018113
- Publication date Jan 25, 2007
- Ionwerks, Inc.
- Marc Gonin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Fast time-of-flight mass spectrometer with improved data acquisitio...
- Publication number 20060192111
- Publication date Aug 31, 2006
- Katrin Fuhrer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Ion mobility spectrometer
- Publication number 20050189486
- Publication date Sep 1, 2005
- Katrin Fuhrer
- G01 - MEASURING TESTING
Information Patent Application
Time-of-flight mass spectrometer for monitoring of fast processes
- Publication number 20050127289
- Publication date Jun 16, 2005
- Katrin Fuhrer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Multi-anode detector with increased dynamic range for time-of-fligh...
- Publication number 20050040325
- Publication date Feb 24, 2005
- Marc Gonin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Fast time-of-flight mass spectrometer with improved data acquisitio...
- Publication number 20050006577
- Publication date Jan 13, 2005
- IONWERKS
- Katrin Fuhrer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Multi-anode detector with increased dynamic range for time-of-fligh...
- Publication number 20040217275
- Publication date Nov 4, 2004
- Ionwerks, Inc.
- Marc Gonin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Time-of-flight mass spectrometer for monitoring of fast processes
- Publication number 20040113064
- Publication date Jun 17, 2004
- Katrin Fuhrer
- G01 - MEASURING TESTING
Information Patent Application
Multi-anode detector with increased dynamic range for time-of-fligh...
- Publication number 20040046117
- Publication date Mar 11, 2004
- IONWERKS
- Marc Gonin
- H01 - BASIC ELECTRIC ELEMENTS

Person

Patents Grantslast 30 patents

Ion molecule reactor and setup for analyzing complex mixtures

Autosampler

Apparatus and method for analysing a chemical composition of aeroso...

Method and an apparatus for determining a spectrum

Apparatus and method for mass spectrometry

Device for mass spectrometry

Compact aerosol time-of-flight mass spectrometer

Fast time-of-flight mass spectrometer with improved data acquisitio...

Ion guide chamber

Fast time-of-flight mass spectrometer with improved dynamic range

Fast time-of-flight mass spectrometer with improved data acquisitio...

Multi-anode detector with increased dynamic range for time-of-fligh...

Ion mobility spectrometer

Multi-anode detector with increased dynamic range for time-of-fligh...

Fast time-of-flight mass spectrometer with improved data acquisitio...

Time-of-flight mass spectrometer for monitoring of fast processes

Multi-anode detector with increased dynamic range for time-of-fligh...

Time-of-flight mass spectrometer for monitoring of fast processes

Multi-anode detector with increased dynamic range for time-of-fligh...

Electrostatic ion trap mass spectrometers

Patents Applicationslast 30 patents

METHOD AND APPARATUS FOR DETECTING ONE OR MORE LEAKS IN A BATTERY E...

ION MOLECULE REACTOR AND SETUP FOR ANALYZING COMPLEX MIXTURES

METHOD AND APPARATUS FOR MASS ANALYSING A SAMPLE

AUTOSAMPLER

ION MOLECULE REACTOR AND SETUP FOR ANALYZING COMPLEX MIXTURES

APPARATUS AND METHOD FOR ANALYSING A CHEMICAL COMPOSITION OF AEROSO...

APPARATUS AND METHOD FOR MASS SPECTROMETRY

METHOD AND AN APPARATUS FOR DETERMINING A SPECTRUM

DEVICE FOR MASS SPECTROMETRY

Pulsed Mass Calibration in Time-of-Flight Mass Spectrometry

FAST TIME-OF-FLIGHT MASS SPECTROMETER WITH IMPROVED DATA ACQUISITIO...

FAST TIME-OF-FLIGHT MASS SPECTROMETER WITH IMPROVED DYNAMIC RANGE

ION GUIDE CHAMBER

APPARATUS FOR MASS ANALYSIS OF IONS

Multi-anode detector with increased dynamic range for time-of-fligh...

Fast time-of-flight mass spectrometer with improved data acquisitio...

Ion mobility spectrometer

Time-of-flight mass spectrometer for monitoring of fast processes

Multi-anode detector with increased dynamic range for time-of-fligh...

Fast time-of-flight mass spectrometer with improved data acquisitio...

Multi-anode detector with increased dynamic range for time-of-fligh...

Time-of-flight mass spectrometer for monitoring of fast processes

Multi-anode detector with increased dynamic range for time-of-fligh...