Membership
Tour
Register
Log in
Marc Himel
Follow
Person
Winter Springs, FL, US
People
Overview
Industries
Organizations
People
Information
Impact
Patents Grants
last 30 patents
Information
Patent Grant
Light-source characterizer and associated methods
Patent number
11,463,675
Issue date
Oct 4, 2022
JENOPTIK OPTICAL SYSTEMS, LLC
Marc D. Himel
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Light-source characterizer and associated methods
Patent number
11,019,326
Issue date
May 25, 2021
JENOPTIK OPTICAL SYSTEMS, LLC
Marc D. Himel
G01 - MEASURING TESTING
Information
Patent Grant
Device for measuring a power density distribution of a radiation so...
Patent number
9,518,865
Issue date
Dec 13, 2016
Jenoptik Optical Systems GmbH
Tobias Gnausch
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
LIGHT-SOURCE CHARACTERIZER AND ASSOCIATED METHODS
Publication number
20210258559
Publication date
Aug 19, 2021
JENOPTIK Optical Systems LLC
Marc D. Himel
G01 - MEASURING TESTING
Information
Patent Application
LIGHT-SOURCE CHARACTERIZER AND ASSOCIATED METHODS
Publication number
20190253701
Publication date
Aug 15, 2019
JENOPTIK Optical Systems LLC
Marc D. Himel
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
DEVICE FOR MEASURING A POWER DENSITY DISTRIBUTION OF A RADIATION SO...
Publication number
20150060683
Publication date
Mar 5, 2015
JENOPTIK OPTICAL SYSTEMS GMBH
Tobias GNAUSCH
G01 - MEASURING TESTING
Information
Patent Application
Wafer-Scale Emitter Package Including Thermal Vias
Publication number
20120199857
Publication date
Aug 9, 2012
DigitalOptics Corporation East
Giles Humpston
H01 - BASIC ELECTRIC ELEMENTS