Marc Jacobs

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Redwood City, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Coaxial-interconnect structure for a semiconductor component
- Patent number 10,734,334
- Issue date Aug 4, 2020
- Marvell Asia Pte, Ltd.
- Marc Jacobs
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multi-test type probe card and corresponding testing system for par...
- Patent number 10,620,236
- Issue date Apr 14, 2020
- Marvell Asia Pte, Ltd.
- David Ganapol
- G01 - MEASURING TESTING
Information Patent Grant
Methods and apparatus for self-alignment of integrated circuit dies
- Patent number 10,431,515
- Issue date Oct 1, 2019
- Marvell World Trade Ltd.
- Long-Ching Wang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Reducing calibration testing time
- Patent number 9,020,439
- Issue date Apr 28, 2015
- Marvell International Ltd.
- Kai Chieh Chan
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Field programmable digital image capture device
- Patent number 8,698,953
- Issue date Apr 15, 2014
- Marvell International Ltd.
- Hsui-Ping Peng
- H04 - ELECTRIC COMMUNICATION TECHNIQUE

Patents Applicationslast 30 patents

Information Patent Application
Methods and Apparatus for Testing an Integrated Circuit
- Publication number 20190242941
- Publication date Aug 8, 2019
- Marvell World Trade Ltd.
- Scott Wu
- G01 - MEASURING TESTING
Information Patent Application
Coaxial-Interconnect Structure for a Semiconductor Component
- Publication number 20190237418
- Publication date Aug 1, 2019
- Marvell World Trade Ltd.
- Marc Jacobs
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MULTI-TEST TYPE PROBE CARD AND CORRESPONDING TESTING SYSTEM FOR PAR...
- Publication number 20180356444
- Publication date Dec 13, 2018
- Marvell World Trade Ltd.
- David Ganapol
- G01 - MEASURING TESTING
Information Patent Application
Apparatus for Super-Fine Pitch Integrated Circuit Testing and Metho...
- Publication number 20180275169
- Publication date Sep 27, 2018
- Marvell World Trade Ltd.
- Marc Jacobs
- G01 - MEASURING TESTING
Information Patent Application
Methods and Apparatus for Self-Alignment of Integrated Circuit Dies
- Publication number 20180068921
- Publication date Mar 8, 2018
- Marvell World Trade Ltd.
- Long-Ching Wang
- G06 - COMPUTING CALCULATING COUNTING