Marc Johannes Noot

Person

Eindhoven, NL

People

Patents Grantslast 30 patents

Information Patent Grant
Metrology method
- Patent number 12,013,647
- Issue date Jun 18, 2024
- ASML Netherlands B.V.
- Simon Gijsbert Josephus Mathijssen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Metrology method and apparatus and computer program
- Patent number 10,908,513
- Issue date Feb 2, 2021
- ASML Netherlands B.V.
- Marc Johannes Noot
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Metrology method and apparatus, computer program and lithographic s...
- Patent number 10,705,437
- Issue date Jul 7, 2020
- ASML Netherlands B.V.
- Narjes Javaheri
- G01 - MEASURING TESTING
Information Patent Grant
Metrology parameter determination and metrology recipe selection
- Patent number 10,451,978
- Issue date Oct 22, 2019
- ASML Netherlands B.V.
- Kaustuve Bhattacharyya
- G01 - MEASURING TESTING
Information Patent Grant
Inspection method and apparatus, and corresponding lithographic app...
- Patent number 10,295,913
- Issue date May 21, 2019
- ASML Netherlands B.V.
- Scott Anderson Middlebrooks
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Patents Applicationslast 30 patents

Information Patent Application
SOURCE SEPARATION FROM METROLOGY DATA
- Publication number 20250004385
- Publication date Jan 2, 2025
- ASML NETHERLANDS B.V.
- Marc Johannes NOOT
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METROLOGY METHOD
- Publication number 20220075276
- Publication date Mar 10, 2022
- ASML NETHERLANDS B.V.
- Simon Gijsbert Josephus MATHIJSSEN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Metrology Method and Apparatus, Computer Program and Lithographic S...
- Publication number 20190107785
- Publication date Apr 11, 2019
- ASML NETHERLANDS B.V.
- Narjes JAVAHERI
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Metrology Method and Apparatus and Computer Program
- Publication number 20190033727
- Publication date Jan 31, 2019
- ASML NETHERLANDS B.V.
- Marc Johannes NOOT
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
METROLOGY PARAMETER DETERMINATION AND METROLOGY RECIPE SELECTION
- Publication number 20190004437
- Publication date Jan 3, 2019
- ASML NETHERLANDS B.V.
- Kaustuve Bhattacharyya
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Inspection Method and Apparatus, and Corresponding Lithographic App...
- Publication number 20130135600
- Publication date May 30, 2013
- ASML NETHERLANDS B.V.
- Scott Anderson MIDDLEBROOKS
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Marc Johannes Noot

Person

Patents Grantslast 30 patents

Metrology method

Metrology method and apparatus and computer program

Metrology method and apparatus, computer program and lithographic s...

Metrology parameter determination and metrology recipe selection

Inspection method and apparatus, and corresponding lithographic app...

Patents Applicationslast 30 patents

SOURCE SEPARATION FROM METROLOGY DATA

METROLOGY METHOD

Metrology Method and Apparatus, Computer Program and Lithographic S...

Metrology Method and Apparatus and Computer Program

METROLOGY PARAMETER DETERMINATION AND METROLOGY RECIPE SELECTION

Inspection Method and Apparatus, and Corresponding Lithographic App...