Marc Jurian KEA

Person

Morgan Hill, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Method for characterizing a manufacturing process of semiconductor...
- Patent number 11,860,548
- Issue date Jan 2, 2024
- ASML Netherlands B.V.
- Wim Tjibbo Tel
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Defect prediction
- Patent number 11,403,453
- Issue date Aug 2, 2022
- ASML Netherlands B.V.
- Lin Lee Cheong
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of determining a position of a feature
- Patent number 11,392,044
- Issue date Jul 19, 2022
- ASML Netherlands B.V.
- Ralph Timotheus Huijgen
- G01 - MEASURING TESTING
Information Patent Grant
Control based on probability density function of parameter
- Patent number 11,143,971
- Issue date Oct 12, 2021
- ASML Netherlands B.V.
- Wim Tjibbo Tel
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method of determining a position of a feature
- Patent number 10,578,980
- Issue date Mar 3, 2020
- ASML Netherlands B.V.
- Ralph Timotheus Huijgen
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Patents Applicationslast 30 patents

Information Patent Application
A METHOD FOR CHARACTERIZING A MANUFACTURING PROCESS OF SEMICONDUCTO...
- Publication number 20240111218
- Publication date Apr 4, 2024
- ASML NETHERLANDS B.V.
- Wim Tjibbo TEL
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
TOPOLOGY-BASED IMAGE RENDERING IN CHARGED-PARTICLE BEAM INSPECTION...
- Publication number 20240037890
- Publication date Feb 1, 2024
- ASML NETHERLANDS B.V.
- Haoyi LIANG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
A METHOD FOR CHARACTERIZING A MANUFACTURING PROCESS OF SEMICONDUCTO...
- Publication number 20220100098
- Publication date Mar 31, 2022
- ASML NETHERLANDS B.V.
- Wim Tjibbo TEL
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
DEFECT PREDICTION
- Publication number 20210150115
- Publication date May 20, 2021
- ASML NETHERLANDS B.V.
- Lin Lee CHEONG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CONTROL BASED ON PROBABILITY DENSITY FUNCTION OF PARAMETER
- Publication number 20210080838
- Publication date Mar 18, 2021
- ASML NETHERLANDS B.V.
- Wim Tjibbo TEL
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
METHOD OF DETERMINING A POSITION OF A FEATURE
- Publication number 20200150547
- Publication date May 14, 2020
- ASML NETHERLANDS B.V.
- Ralph Timotheus HUIJGEN
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
METHOD OF DETERMINING A POSITION OF A FEATURE
- Publication number 20190339211
- Publication date Nov 7, 2019
- Ralph Timotheus HUIJGEN
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Marc Jurian KEA

Person

Patents Grantslast 30 patents

Method for characterizing a manufacturing process of semiconductor...

Defect prediction

Method of determining a position of a feature

Control based on probability density function of parameter

Method of determining a position of a feature

Patents Applicationslast 30 patents

A METHOD FOR CHARACTERIZING A MANUFACTURING PROCESS OF SEMICONDUCTO...

TOPOLOGY-BASED IMAGE RENDERING IN CHARGED-PARTICLE BEAM INSPECTION...

A METHOD FOR CHARACTERIZING A MANUFACTURING PROCESS OF SEMICONDUCTO...

DEFECT PREDICTION

CONTROL BASED ON PROBABILITY DENSITY FUNCTION OF PARAMETER

METHOD OF DETERMINING A POSITION OF A FEATURE

METHOD OF DETERMINING A POSITION OF A FEATURE