Marc P. Loranger

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Livermore, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Test systems and methods for testing electronic devices
- Patent number 8,587,331
- Issue date Nov 19, 2013
- Tommie E. Berry
- G01 - MEASURING TESTING
Information Patent Grant
Test system for integrated circuits with serdes ports
- Patent number 7,058,535
- Issue date Jun 6, 2006
- Credence Systems Corporation
- Gordon Edward Chenoweth
- G01 - MEASURING TESTING
Information Patent Grant
Partitionable embedded circuit test system for integrated circuit
- Patent number 6,587,979
- Issue date Jul 1, 2003
- Credence Systems Corporation
- Lawrence Kraus
- G11 - INFORMATION STORAGE
Information Patent Grant
Field programmable gate array with program encryption
- Patent number 6,351,814
- Issue date Feb 26, 2002
- Credence Systems Corporation
- Ivan-Pierre Batinic
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
TEST SYSTEMS AND METHODS FOR TESTING ELECTRONIC DEVICES
- Publication number 20110156734
- Publication date Jun 30, 2011
- FormFactor, Inc.
- Tommie E. Berry
- G01 - MEASURING TESTING
Information Patent Application
Test system for integrated circuits with serdes ports
- Publication number 20050182588
- Publication date Aug 18, 2005
- Gordon Edward Chenoweth
- G01 - MEASURING TESTING
Information Patent Application
Partitionable embedded circuit test system for integrated circuit
- Publication number 20030167427
- Publication date Sep 4, 2003
- CREDENCE SYSTEMS CORPORATION
- Lawrence Kraus
- G11 - INFORMATION STORAGE