Marc Reuben Hutner

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Toronto, CA

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Patents Grantslast 30 patents

Information Patent Grant
Controlling a per-pin measurement unit
- Patent number 10,451,653
- Issue date Oct 22, 2019
- Teradyne, Inc.
- Marc Spehlmann
- G01 - MEASURING TESTING
Information Patent Grant
Debugging in a semiconductor device test environment
- Patent number 9,959,186
- Issue date May 1, 2018
- Teradyne, Inc.
- Marc Reuben Hutner
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Automated test system with event detection capability
- Patent number 9,244,126
- Issue date Jan 26, 2016
- Teradyne, Inc.
- Ronald A. Sartschev
- H04 - ELECTRIC COMMUNICATION TECHNIQUE

Patents Applicationslast 30 patents

Information Patent Application
CONTROLLING A PER-PIN MEASUREMENT UNIT
- Publication number 20160178667
- Publication date Jun 23, 2016
- Teradyne, Inc.
- Marc Spehlmann
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATED TEST SYSTEM WITH EVENT DETECTION CAPABILITY
- Publication number 20150128003
- Publication date May 7, 2015
- Teradyne, Inc.
- Ronald A. Sartschev
- G01 - MEASURING TESTING
Information Patent Application
DEBUGGING IN A SEMICONDUCTOR DEVICE TEST ENVIRONMENT
- Publication number 20140143600
- Publication date May 22, 2014
- Teradyne, Inc.
- Marc Reuben Hutner
- G06 - COMPUTING CALCULATING COUNTING