Marcel Pelgrom

Person

Helmond, NL

People

Patents Grantslast 30 patents

Information Patent Grant
Simple and stable reference for IR-drop and supply noise measurements
- Patent number 8,874,394
- Issue date Oct 28, 2014
- NXP, B.V.
- Hendricus Joseph Maria Veendrick
- G01 - MEASURING TESTING
Information Patent Grant
Secure storage of a codeword within an integrated circuit
- Patent number 8,690,065
- Issue date Apr 8, 2014
- NXP B.V.
- Marcel Pelgrom
- G11 - INFORMATION STORAGE
Information Patent Grant
DLL for period jitter measurement
- Patent number 8,203,368
- Issue date Jun 19, 2012
- NXP B.V.
- Marcel J. M. Pelgrom
- G01 - MEASURING TESTING
Information Patent Grant
Voltage reference circuit for low supply voltages
- Patent number 8,022,752
- Issue date Sep 20, 2011
- NXP B.V.
- Marcel J. M. Pelgrom
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Monitoring physical operating parameters of an integrated circuit
- Patent number 7,928,882
- Issue date Apr 19, 2011
- NXP B.V.
- Hendricus J M Veendrick
- G01 - MEASURING TESTING
Information Patent Grant
On silicon interconnect capacitance extraction
- Patent number 7,791,357
- Issue date Sep 7, 2010
- NXP B.V.
- Praveen Pavithran
- G01 - MEASURING TESTING
Information Patent Grant
Intergrated circuit self-test architecture
- Patent number 7,710,136
- Issue date May 4, 2010
- NXP B.V.
- Marcel Pelgrom
- G01 - MEASURING TESTING
Information Patent Grant
Flash analog-to-digital converter
- Patent number 7,605,740
- Issue date Oct 20, 2009
- NXP B.V.
- Marcel Pelgrom
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Supply voltage monitoring
- Patent number 7,538,570
- Issue date May 26, 2009
- NXP B.V.
- Marcel Pelgrom
- G01 - MEASURING TESTING
Information Patent Grant
Comb filter arrangement having delay time compensation and load mat...
- Patent number 5,216,495
- Issue date Jun 1, 1993
- U.S. Philips Corporation
- Thomas Suwald
- H04 - ELECTRIC COMMUNICATION TECHNIQUE

Patents Applicationslast 30 patents

Information Patent Application
SECURE STORAGE OF A CODEWORD WITHIN AN INTEGRATED CIRCUIT
- Publication number 20120127775
- Publication date May 24, 2012
- NXP B.V.
- Marcel Pelgrom
- G11 - INFORMATION STORAGE
Information Patent Application
SIMPLE AND STABLE REFERENCE FOR IR-DROP AND SUPPLY NOISE MEASUREMENTS
- Publication number 20110246110
- Publication date Oct 6, 2011
- NXP B.V.
- Hendricus Joseph Maria VeendrickK
- G01 - MEASURING TESTING
Information Patent Application
VOLTAGE REFERENCE CIRCUIT FOR LOW SUPPLY VOLTAGES
- Publication number 20110156804
- Publication date Jun 30, 2011
- NXP B.V.
- Marcel J. M. Pelgrom
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Application
DETECTION CIRCUITRY FOR DETECTING BONDING CONDITIONS ON BOND PADS
- Publication number 20110140730
- Publication date Jun 16, 2011
- NXP B.V.
- Victor Zieren
- G01 - MEASURING TESTING
Information Patent Application
DLL FOR PERIOD JITTER MEASUREMENT
- Publication number 20110128055
- Publication date Jun 2, 2011
- NXP B.V.
- Marcel J.M. Pelgrom
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor device with test structure and semiconductor device t...
- Publication number 20100315114
- Publication date Dec 16, 2010
- NXP B.V.
- Marcel Pelgrom
- G01 - MEASURING TESTING
Information Patent Application
Flash Analog-to-Digital Converter
- Publication number 20080309541
- Publication date Dec 18, 2008
- NXP B.V.
- Marcel Pelgrom
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Supply Voltage Monitoring
- Publication number 20080191732
- Publication date Aug 14, 2008
- NXP B.V.
- Marcel Pelgrom
- G01 - MEASURING TESTING
Information Patent Application
On Silicon Interconnect Capacitance Extraction
- Publication number 20080143348
- Publication date Jun 19, 2008
- Koninklijke Philips Electronics N.V.
- Praveen Pavithran
- G01 - MEASURING TESTING
Information Patent Application
Monnitoring Physical Operating Parameters Of An Integrated Circuit
- Publication number 20080007246
- Publication date Jan 10, 2008
- Koninklijke Philips Electronics N.V.
- Hendricus J.M. Veendrick
- G01 - MEASURING TESTING

Marcel Pelgrom

Person

Patents Grantslast 30 patents

Simple and stable reference for IR-drop and supply noise measurements

Secure storage of a codeword within an integrated circuit

DLL for period jitter measurement

Voltage reference circuit for low supply voltages

Monitoring physical operating parameters of an integrated circuit

On silicon interconnect capacitance extraction

Intergrated circuit self-test architecture

Flash analog-to-digital converter

Supply voltage monitoring

Comb filter arrangement having delay time compensation and load mat...

Patents Applicationslast 30 patents

SECURE STORAGE OF A CODEWORD WITHIN AN INTEGRATED CIRCUIT

SIMPLE AND STABLE REFERENCE FOR IR-DROP AND SUPPLY NOISE MEASUREMENTS

VOLTAGE REFERENCE CIRCUIT FOR LOW SUPPLY VOLTAGES

DETECTION CIRCUITRY FOR DETECTING BONDING CONDITIONS ON BOND PADS

DLL FOR PERIOD JITTER MEASUREMENT

Semiconductor device with test structure and semiconductor device t...

Flash Analog-to-Digital Converter

Supply Voltage Monitoring

On Silicon Interconnect Capacitance Extraction

Monnitoring Physical Operating Parameters Of An Integrated Circuit