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Marcel Trimpl
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San Jose, CA, US
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Patents Grants
last 30 patents
Information
Patent Grant
Segmented multi-channel, backside illuminated, solid state detector...
Patent number
11,699,607
Issue date
Jul 11, 2023
KLA Corporation
John Gerling
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Sensor module for scanning electron microscopy applications
Patent number
11,610,757
Issue date
Mar 21, 2023
KLA Corporation
Marcel Trimpl
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Scanning electron microscope and methods of inspecting and reviewin...
Patent number
10,466,212
Issue date
Nov 5, 2019
KLA-Tencor Corporation
David L. Brown
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Scanning electron microscope and methods of inspecting and reviewin...
Patent number
9,767,986
Issue date
Sep 19, 2017
KLA-Tencor Corporation
David L. Brown
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
Information
Patent Application
SENSOR MODULE FOR SCANNING ELECTRON MICROSCOPY APPLICATIONS
Publication number
20230230800
Publication date
Jul 20, 2023
KLA Corporation
Marcel Trimpl
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SEGMENTED MULTI-CHANNEL, BACKSIDE ILLUMINATED, SOLID STATE DETECTOR...
Publication number
20220399220
Publication date
Dec 15, 2022
KLA Corporation
John Gerling
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SENSOR MODULE FOR SCANNING ELECTRON MICROSCOPY APPLICATIONS
Publication number
20210066035
Publication date
Mar 4, 2021
KLA Corporation
Marcel Trimpl
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Scanning Electron Microscope And Methods Of Inspecting And Reviewin...
Publication number
20170329025
Publication date
Nov 16, 2017
KLA-Tencor Corporation
David L. Brown
G01 - MEASURING TESTING
Information
Patent Application
Scanning Electron Microscope And Methods Of Inspecting And Reviewin...
Publication number
20160064184
Publication date
Mar 3, 2016
KLA-Tencor Corporation
David L. Brown
H01 - BASIC ELECTRIC ELEMENTS