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Marcelo Gabriel BACHER
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Givatayim, IL
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Patents Grants
last 30 patents
Information
Patent Grant
Selecting a representative subset of potential defects to improve d...
Patent number
11,940,390
Issue date
Mar 26, 2024
Applied Materials Israel Ltd.
Yotam Sofer
G06 - COMPUTING CALCULATING COUNTING
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Patent Grant
Selecting a coreset of potential defects for estimating expected de...
Patent number
11,360,030
Issue date
Jun 14, 2022
Applied Materials Isreal Ltd
Yotam Sofer
G06 - COMPUTING CALCULATING COUNTING
Patents Applications
last 30 patents
Information
Patent Application
MATCHING BASED DEFECT EXAMINATION FOR SEMICONDUCTOR SPECIMENS
Publication number
20250191177
Publication date
Jun 12, 2025
APPLIED MATERIALS ISRAEL LTD.
Yuval ALFASSI
G06 - COMPUTING CALCULATING COUNTING
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Patent Application
MACHINE LEARNING BASED DEFECT EXAMINATION AND RANKING FOR SEMICONDU...
Publication number
20250124307
Publication date
Apr 17, 2025
APPLIED MATERIALS ISRAEL LTD.
Aviad YAHALOM
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
METHOD OF EXAMINING SPECIMENS AND SYSTEM THEREOF
Publication number
20220291138
Publication date
Sep 15, 2022
APPLIED MATERIALS ISRAEL LTD.
Yotam SOFER
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
METHOD OF EXAMINING SPECIMENS AND SYSTEM THEREOF
Publication number
20210239623
Publication date
Aug 5, 2021
APPLIED MATERIALS ISRAEL LTD.
Yotam SOFER
G01 - MEASURING TESTING