San Diego, CA, US
Information
Patent Grant
United States of America as represented by the Secretary of the Navy
Eric C. Fisher
G01 - MEASURING TESTING
Information
Patent Grant
United States of America as represented by the Secretary of the Navy
Ayax D. Ramirez
G01 - MEASURING TESTING
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Patent Grant
United States of America as represented by the Secretary of the Navy
Eric C. Fisher
H03 - BASIC ELECTRONIC CIRCUITRY
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Patent Grant
United States Government as represented by the Secretary of the Navy
Anna Leese de Escobar
G01 - MEASURING TESTING
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Patent Grant
United States of America as represented by the Secretary of the Navy
Anna Leese de Escobar
H01 - BASIC ELECTRIC ELEMENTS
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Patent Grant
United States of America as represented by the Secretary of the Navy
Lee Lemay
H04 - ELECTRIC COMMUNICATION TECHNIQUE
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Patent Grant
United States of America as represented by the Secretary of the Navy
Susan Anne Elizabeth Berggren
Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC
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Patent Grant
The United States of America, as represented by the Secretary of the Navy
Marcio C. de Andrade
G01 - MEASURING TESTING
Information
Patent Grant
The United States of America, as represented by the Secretary of the Navy
Anna M. Leese de Escobar
G01 - MEASURING TESTING
Information
Patent Grant
The United States of America as represented by Secretary of the Navy
Marcio C. de Andrade
G01 - MEASURING TESTING
Information
Patent Grant
The United States of America as represented by the Secretary of the Navy
Nackieb Kamin
H01 - BASIC ELECTRIC ELEMENTS
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Patent Grant
The United States of America as represented by the Secretary of the Navy
Marcio C. De Andrade
H01 - BASIC ELECTRIC ELEMENTS
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Patent Application
The United States of America as represented by the Secretary of the Navy
Sergio A. Montoya
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Patent Application
The United States of America, as represented by the Secretary of the Navy
Marcio Calixto de Andrade
G01 - MEASURING TESTING
Information
Patent Application
United States of America as represented by the Secretary of the Navy
Eric C. Fisher
G01 - MEASURING TESTING
Information
Patent Application
The United States of America as represented by the Secretary of the Navy
Eric C. Fisher
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
United States of America, as Represented by the Se cretary of the Navy
Ayax D. Ramirez
G01 - MEASURING TESTING
Information
Patent Application
United States Government as represented by the Secretary of the Navy
Anna Leese de Escobar
G01 - MEASURING TESTING
Information
Patent Application
United States Governmnet as represented by the Secretary of the Navy
Anna Leese de Escobar
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
The United States of America as represented by the Secretary of the Navy
Lee Lemay
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
United States of America as represented by the Secretary of the Navy
Susan Anne Elizabeth Berggren
G01 - MEASURING TESTING
Information
Patent Application
The United States of America as represented by the Secretary of the Navy
Nackieb M. Kamin
G01 - MEASURING TESTING
Information
Patent Application
United States of America as represented by Secretary of the Navy
Nackieb M. Kamin
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
United States of America, as Represented by the Secretary of the Navy
Marcio C. de Andrade
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
United States of America, as Represented by the Secretary of the Navy
Anna M. Leese de Escobar
G01 - MEASURING TESTING
Information
Patent Application
Bennette M. Butters
G01 - MEASURING TESTING
