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Marco A. Gardner
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Tucson, AZ, US
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Patents Grants
last 30 patents
Information
Patent Grant
Integrated photodetector
Patent number
12,087,870
Issue date
Sep 10, 2024
Texas Instruments Incorporated
Debarshi Basu
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Integrated photodetector
Patent number
11,094,837
Issue date
Aug 17, 2021
Texas Instruments Incorporated
Debarshi Basu
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Integrated photodetector
Patent number
10,186,623
Issue date
Jan 22, 2019
Texas Instruments Incorporated
Debarshi Basu
G01 - MEASURING TESTING
Information
Patent Grant
Serial interface
Patent number
9,003,096
Issue date
Apr 7, 2015
Texas Instruments Incorporated
Dimitar T. Trifonov
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Systems and methods for temperature measurement using n-factor coef...
Patent number
7,648,271
Issue date
Jan 19, 2010
Texas Instruments Incorporated
Jerry L. Doorenbos
G01 - MEASURING TESTING
Information
Patent Grant
Systems and methods for PWM clocking in a temperature measurement c...
Patent number
7,637,658
Issue date
Dec 29, 2009
Texas Instruments Incorporated
Marco A. Gardner
G01 - MEASURING TESTING
Information
Patent Grant
Common mode feedback for large output swing and low differential error
Patent number
7,592,867
Issue date
Sep 22, 2009
Texas Instruments Incorporated
Dimitar T. Trifonov
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Systems and methods for resistance compensation in a temperature me...
Patent number
7,524,109
Issue date
Apr 28, 2009
Texas Instruments Incorporated
Marco A. Gardner
G01 - MEASURING TESTING
Information
Patent Grant
Hybrid delta-sigma/SAR analog to digital converter and methods for...
Patent number
7,504,977
Issue date
Mar 17, 2009
Texas Instruments Incorporated
Jerry L. Doorenbos
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Reduced pin count scan chain implementation
Patent number
7,380,185
Issue date
May 27, 2008
Texas Instruments Incorporated
Jerry L. Doorenbos
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
Integrated Photodetector
Publication number
20240387757
Publication date
Nov 21, 2024
TEXAS INSTRUMENTS INCORPORATED
Debarshi Basu
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Integrated Photodetector
Publication number
20210343884
Publication date
Nov 4, 2021
TEXAS INSTRUMENTS INCORPORATED
Debarshi Basu
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Integrated Photodetector
Publication number
20190109245
Publication date
Apr 11, 2019
TEXAS INSTRUMENTS INCORPORATED
Debarshi Basu
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Integrated Photodetector
Publication number
20170229592
Publication date
Aug 10, 2017
TEXAS INSTRUMENTS INCORPORATED
Debarshi Basu
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SERIAL INTERFACE
Publication number
20120239841
Publication date
Sep 20, 2012
TEXAS INSTRUMENTS INCORPORATED
Dimitar T. Trifonov
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Systems and Methods for PWM Clocking in a Temperature Measurement C...
Publication number
20080259997
Publication date
Oct 23, 2008
TEXAS INSTRUMENTS INCORPORATED
Marco A. Gardner
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
Hybrid Delta-Sigma/SAR Analog to Digital Converter and Methods for...
Publication number
20080258951
Publication date
Oct 23, 2008
Taxas Instruments Incorporated
Jerry L. Doorenbos
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
Systems and Methods for Temperature Measurement Using N-Factor Coef...
Publication number
20080259989
Publication date
Oct 23, 2008
TEXAS INSTRUMENTS INCORPORATED
Jerry L. Doorenbos
G01 - MEASURING TESTING
Information
Patent Application
Systems and Methods for Resistance Compensation in a Temperature Me...
Publication number
20080259999
Publication date
Oct 23, 2008
TEXAS INSTRUMENTS INCORPORATED
Marco A. Gardner
G01 - MEASURING TESTING
Information
Patent Application
Common mode feedback for large output swing and low differential error
Publication number
20080246543
Publication date
Oct 9, 2008
Texas Instruments Inc.
Dimitar T. Trifonov
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
Reduced pin count scan chain implementation
Publication number
20070143653
Publication date
Jun 21, 2007
Jerry L. Doorenbos
G01 - MEASURING TESTING