Marco ALVES

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Newark, NJ, US

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Patents Grantslast 30 patents

Information Patent Grant
Non-destructive inspection and manufacturing metrology systems and...
- Patent number 12,092,565
- Issue date Sep 17, 2024
- Onto Innovation Inc.
- Manjusha Mehendale
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
NON-DESTRUCTIVE INSPECTION AND MANUFACTURING METROLOGY SYSTEMS AND...
- Publication number 20240402074
- Publication date Dec 5, 2024
- ONTO INNOVATION INC.
- Manjusha Mehendale
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR FAST MICROSCOPY
- Publication number 20240337627
- Publication date Oct 10, 2024
- ONTO INNOVATION INC.
- Manjusha MEHENDALE
- G01 - MEASURING TESTING
Information Patent Application
NON-DESTRUCTIVE INSPECTION AND MANUFACTURING METROLOGY SYSTEMS AND...
- Publication number 20220228973
- Publication date Jul 21, 2022
- ONTO INNOVATION INC.
- Manjusha MEHENDALE
- G01 - MEASURING TESTING