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Marco Hugo Petrus Moers
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Patents Grants
last 30 patents
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Patent Grant
Charged particle microscope with barometric pressure correction
Patent number
9,601,310
Issue date
Mar 21, 2017
FEI Company
Marco Hugo Petrus Moers
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Imaging a sample in a TEM equipped with a phase plate
Patent number
8,835,846
Issue date
Sep 16, 2014
FEI Company
Bart Buijsse
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
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Patent Application
CHARGED PARTICLE MICROSCOPE WITH BAROMETRIC PRESSURE CORRECTION
Publication number
20160133437
Publication date
May 12, 2016
FEI Company
Marco Hugo Petrus Moers
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
IMAGING A SAMPLE IN A TEM EQUIPPED WITH A PHASE PLATE
Publication number
20140061463
Publication date
Mar 6, 2014
Max-Planck-Gesellschaft zur Gorderung der Wissenschaften e.V.
Bart Buijsse
H01 - BASIC ELECTRIC ELEMENTS