Marco Pieters

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Eindhoven, NL

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Patents Grantslast 30 patents

Information Patent Grant
Inspection method, lithographic apparatus, mask and substrate
- Patent number 10,394,137
- Issue date Aug 27, 2019
- ASML Netherlands B.V.
- Youri Johannes Laurentius Maria Van Dommelen
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Inspection method, lithographic apparatus, mask and substrate
- Patent number 10,001,711
- Issue date Jun 19, 2018
- ASML Netherlands B.V.
- Youri Johannes Laurentius Maria Van Dommelen
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Lithographic apparatus focus test method and system, and device man...
- Patent number 7,209,214
- Issue date Apr 24, 2007
- ASML Netherlands B.V.
- Jan Hauschild
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Patents Applicationslast 30 patents

Information Patent Application
INSPECTION METHOD, LITHOGRAPHIC APPARATUS, MASK AND SUBSTRATE
- Publication number 20180253018
- Publication date Sep 6, 2018
- ASML NETHERLANDS B.V.
- Youri Johannes Laurentius Maria VAN DOMMELEN
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
INSPECTION METHOD, LITHOGRAPHIC APPARATUS, MASK AND SUBSTRATE
- Publication number 20160313656
- Publication date Oct 27, 2016
- ASML NETHERLANDS B.V.
- Youri Johannes Laurentius Maria VAN DOMMELEN
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Lithographic apparatus focus test method and system, and device man...
- Publication number 20060132744
- Publication date Jun 22, 2006
- ASML NETHERLANDS B.V.
- Jan Hauschild
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY