Marco Tortonese

Person

Standford, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Verification of computer simulation of photolithographic process
- Patent number 8,943,443
- Issue date Jan 27, 2015
- KLA-Tencor Corporation
- Marco Tortonese
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Verification of computer simulation of photolithographic process
- Patent number 8,245,161
- Issue date Aug 14, 2012
- KLA-Tencor Corporation
- Marco Tortonese
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Calibration standard for a dual beam (FIB/SEM) machine
- Patent number 7,576,317
- Issue date Aug 18, 2009
- KLA-Tencor Technologies Corporation
- Marco Tortonese
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Dimensional calibration standards
- Patent number 7,453,571
- Issue date Nov 18, 2008
- KLA-Tencor Corporation
- Marco Tortonese
- G01 - MEASURING TESTING
Information Patent Grant
Atomic force microscope
- Patent number 7,423,264
- Issue date Sep 9, 2008
- KLA-Tencor Technologies Corporation
- Christopher F. Bevis
- G01 - MEASURING TESTING
Information Patent Grant
Calibration standard for a dual beam (FIB/SEM) machine
- Patent number 7,372,016
- Issue date May 13, 2008
- KLA-Tencor Technologies Corporation
- Marco Tortonese
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Dimensional calibration standards
- Patent number 7,301,638
- Issue date Nov 27, 2007
- KLA-Tencor, Inc.
- Marco Tortonese
- G01 - MEASURING TESTING
Information Patent Grant
Structure and method for mounting a small sample in an opening in a...
- Patent number 6,821,812
- Issue date Nov 23, 2004
- KLA-Tencor Technologies Corporation
- Marco Tortonese
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Submicron dimensional calibration standards and methods of manufact...
- Patent number 6,646,737
- Issue date Nov 11, 2003
- KLA Tencor Technologies
- Marco Tortonese
- G01 - MEASURING TESTING
Information Patent Grant
Voice coil scanner for use in scanning probe microscope
- Patent number 6,005,251
- Issue date Dec 21, 1999
- Thermomicroscopes Corp.
- John D. Alexander
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Atomic force microscope with integrated optics for attachment to op...
- Patent number 5,952,657
- Issue date Sep 14, 1999
- Thermo Microscopes, Corp.
- John D. Alexander
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Atomic force microscope with integrated optics for attachment to op...
- Patent number 5,866,902
- Issue date Feb 2, 1999
- Park Scientific Instruments
- John D. Alexander
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Atomic force microscope for attachment to optical microscope
- Patent number 5,861,624
- Issue date Jan 19, 1999
- Park Scientific Instruments
- John D. Alexander
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Piezoresistive cantilever with integral tip for scanning probe micr...
- Patent number 5,444,244
- Issue date Aug 22, 1995
- Park Scientific Instruments Corporation
- Michael D. Kirk
- B82 - NANO-TECHNOLOGY

Patents Applicationslast 30 patents

Information Patent Application
Atomic force microscope
- Publication number 20080060426
- Publication date Mar 13, 2008
- KLA-Tencor Technologies Corp.
- Christoper F. Bevis
- G01 - MEASURING TESTING
Information Patent Application
Submicron dimensional calibration standards and methods of manufact...
- Publication number 20030058437
- Publication date Mar 27, 2003
- Marco Tortonese
- B82 - NANO-TECHNOLOGY

Marco Tortonese

Person

Patents Grantslast 30 patents

Verification of computer simulation of photolithographic process

Verification of computer simulation of photolithographic process

Calibration standard for a dual beam (FIB/SEM) machine

Dimensional calibration standards

Atomic force microscope

Calibration standard for a dual beam (FIB/SEM) machine

Dimensional calibration standards

Structure and method for mounting a small sample in an opening in a...

Submicron dimensional calibration standards and methods of manufact...

Voice coil scanner for use in scanning probe microscope

Atomic force microscope with integrated optics for attachment to op...

Atomic force microscope with integrated optics for attachment to op...

Atomic force microscope for attachment to optical microscope

Piezoresistive cantilever with integral tip for scanning probe micr...

Patents Applicationslast 30 patents

Atomic force microscope

Submicron dimensional calibration standards and methods of manufact...