Marcos Hernandez

Person

San Jose, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Solid state ESD SiC simulator
- Patent number 11,846,664
- Issue date Dec 19, 2023
- FEI Company
- Marcos Hernandez
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Low-side coaxial current probe
- Patent number 9,651,576
- Issue date May 16, 2017
- Thermo Keytek LLC
- Marcos Hernandez
- G01 - MEASURING TESTING
Information Patent Grant
Method of manufacture of encapsulated gallium alloy containing switch
- Patent number 8,496,995
- Issue date Jul 30, 2013
- Thermo Fisher Scientific, Inc.
- Marcos Hernandez
- B05 - SPRAYING OR ATOMISING IN GENERAL APPLYING LIQUIDS OR OTHER FLUENT MATER...
Information Patent Grant
Probe interface for electrostatic discharge testing of an integrate...
- Patent number 8,344,746
- Issue date Jan 1, 2013
- Thermo Fisher Scientific Inc.
- Marcos Hernandez
- G01 - MEASURING TESTING
Information Patent Grant
Encapsulated switches employing mercury substitute and methods of m...
- Patent number 7,990,241
- Issue date Aug 2, 2011
- Thermo Fisher Scientific, Inc.
- Marcos Hernandez
- B05 - SPRAYING OR ATOMISING IN GENERAL APPLYING LIQUIDS OR OTHER FLUENT MATER...
Information Patent Grant
Electrical overstress and transient latch-up pulse generation syste...
- Patent number 7,928,737
- Issue date Apr 19, 2011
- Marcos Hernandez
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SOLID STATE ESD SIC SIMULATOR
- Publication number 20240044964
- Publication date Feb 8, 2024
- FEI Company
- Marcos Hernandez
- G01 - MEASURING TESTING
Information Patent Application
SOLID STATE ESD SIC SIMULATOR
- Publication number 20230040961
- Publication date Feb 9, 2023
- FEI Company
- Marcos Hernandez
- G01 - MEASURING TESTING
Information Patent Application
Low-Side Coaxial Current Probe
- Publication number 20150109005
- Publication date Apr 23, 2015
- Thermo KeyTek LLC
- Marcos HERNANDEZ
- G01 - MEASURING TESTING
Information Patent Application
RF ESD DEVICE LEVEL DIFFERENTIAL VOLTAGE MEASUREMENT
- Publication number 20130325390
- Publication date Dec 5, 2013
- Marcos Hernandez
- G01 - MEASURING TESTING
Information Patent Application
RF ESD Device Level Differential Voltage Measurement
- Publication number 20130257453
- Publication date Oct 3, 2013
- Marcos HERNANDEZ
- G01 - MEASURING TESTING
Information Patent Application
Encapsulated Switches Employing Mercury Substitute and Methods of M...
- Publication number 20110265938
- Publication date Nov 3, 2011
- Marcos HERNANDEZ
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEMS AND METHODS FOR CHARGED DEVICE MODEL ELECTROSTATIC DISCHARG...
- Publication number 20100117674
- Publication date May 13, 2010
- THERMO FISHER SCIENTIFIC INC.
- Marcos Hernandez
- G01 - MEASURING TESTING
Information Patent Application
Probe Interface for electrostatic discharge testing of an integrate...
- Publication number 20100079160
- Publication date Apr 1, 2010
- THERMO FISHER SCIENTIFIC INC.
- Marcos Hernandez
- G01 - MEASURING TESTING
Information Patent Application
ELECTRICAL OVERSTRESS AND TRANSIENT LATCH-UP PULSE GENERATION SYSTE...
- Publication number 20090289636
- Publication date Nov 26, 2009
- Marcos Hernandez
- G01 - MEASURING TESTING
Information Patent Application
ENCAPSULATED SWITCHES EMPLOYING MERCURY SUBSTITUTE AND METHODS OF M...
- Publication number 20090184788
- Publication date Jul 23, 2009
- Marcos HERNANDEZ
- H01 - BASIC ELECTRIC ELEMENTS

Marcos Hernandez

Person

Patents Grantslast 30 patents

Solid state ESD SiC simulator

Low-side coaxial current probe

Method of manufacture of encapsulated gallium alloy containing switch

Probe interface for electrostatic discharge testing of an integrate...

Encapsulated switches employing mercury substitute and methods of m...

Electrical overstress and transient latch-up pulse generation syste...

Patents Applicationslast 30 patents

SOLID STATE ESD SIC SIMULATOR

SOLID STATE ESD SIC SIMULATOR

Low-Side Coaxial Current Probe

RF ESD DEVICE LEVEL DIFFERENTIAL VOLTAGE MEASUREMENT

RF ESD Device Level Differential Voltage Measurement

Encapsulated Switches Employing Mercury Substitute and Methods of M...

SYSTEMS AND METHODS FOR CHARGED DEVICE MODEL ELECTROSTATIC DISCHARG...

Probe Interface for electrostatic discharge testing of an integrate...

ELECTRICAL OVERSTRESS AND TRANSIENT LATCH-UP PULSE GENERATION SYSTE...

ENCAPSULATED SWITCHES EMPLOYING MERCURY SUBSTITUTE AND METHODS OF M...