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Marcus Adrianus Van De Kerhof
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Helmond, NL
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Patents Grants
last 30 patents
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Patent Grant
Lithographic apparatus and device manufacturing method
Patent number
8,154,708
Issue date
Apr 10, 2012
ASML Netherlands B.V.
Joeri Lof
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Sensor for use in a lithographic apparatus
Patent number
7,453,078
Issue date
Nov 18, 2008
ASML Netherlands B.V.
Haico Victor Kok
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Sensor for use in a lithographic apparatus
Patent number
7,282,701
Issue date
Oct 16, 2007
ASML Netherlands B.V.
Haico Victor Kok
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Lithographic apparatus, device manufacturing method, and device man...
Patent number
6,906,787
Issue date
Jun 14, 2005
ASML Netherlands B.V.
Marcus Adrianus Van De Kerhof
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
Sensor for use in a lithographic apparatus
Publication number
20080007844
Publication date
Jan 10, 2008
ASML NETHERLANDS B.V.
Haico Victor Kok
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
Sensor for use in a lithographic apparatus
Publication number
20060192093
Publication date
Aug 31, 2006
ASML NETHERLANDS B.V.
Haico Victor Kok
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
Lithographic apparatus, device manufacturing method, and device man...
Publication number
20040114120
Publication date
Jun 17, 2004
ASML NETHERLANDS B.V.
Marcus Adrianus Van De Kerhof
G01 - MEASURING TESTING