Marcus DYBA

Person

Mannheim, DE

People

Patents Grantslast 30 patents

Information Patent Grant
Image processing system
- Patent number 11,763,434
- Issue date Sep 19, 2023
- Leica Microsystems CMS GmbH
- Marcus Dyba
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Scanning device for scanning an object for use in a scanning micros...
- Patent number 11,150,453
- Issue date Oct 19, 2021
- Leica Microsystems CMS GmbH
- Marcus Dyba
- G02 - OPTICS
Information Patent Grant
Device and method for detecting light using a silicon photomultipli...
- Patent number 10,527,835
- Issue date Jan 7, 2020
- Leica Microsystems CMS GmbH
- Manuel Kremer
- G01 - MEASURING TESTING
Information Patent Grant
Method for improving the dynamic range of a device for detecting light
- Patent number 10,488,251
- Issue date Nov 26, 2019
- Leica Microsystems CMS GmbH
- Marcus Dyba
- G02 - OPTICS
Information Patent Grant
Method and device for light-microscopic imaging of a sample structure
- Patent number 9,772,485
- Issue date Sep 26, 2017
- Leica Microsystems CMS GmbH
- Marcus Dyba
- G02 - OPTICS
Information Patent Grant
Device and method for acquiring a microscopic image of a sample str...
- Patent number 9,720,221
- Issue date Aug 1, 2017
- Leica Microsystems CMS GmbH
- Marcus Dyba
- G02 - OPTICS
Information Patent Grant
Microscopic device and microscopic method for the three-dimensional...
- Patent number 9,488,824
- Issue date Nov 8, 2016
- Leica Microsystems CMS GmbH
- Marcus Dyba
- G02 - OPTICS
Information Patent Grant
Phase filters for a scanning microscope
- Patent number 9,250,429
- Issue date Feb 2, 2016
- Leica Microsystems CMS GmbH
- Hilmar Gugel
- G02 - OPTICS
Information Patent Grant
Sample holder for a microscope
- Patent number 8,970,952
- Issue date Mar 3, 2015
- Leica Microsystems CMS GmbH
- Jonas Fölling
- G02 - OPTICS
Information Patent Grant
Device and method for providing a predeterminable concentration of...
- Patent number 8,373,853
- Issue date Feb 12, 2013
- Leica Microsystems CMS GmbH
- Jochen Sieber
- G05 - CONTROLLING REGULATING
Information Patent Grant
Device and method for beam adjustment in an optical beam path
- Patent number 8,319,970
- Issue date Nov 27, 2012
- Leica Microsystems CMS GmbH
- Holger Birk
- G02 - OPTICS
Information Patent Grant
Laser microscope with a physically separating beam splitter
- Patent number 7,999,935
- Issue date Aug 16, 2011
- Leica Microsystems CMS GmbH
- Marcus Dyba
- G01 - MEASURING TESTING
Information Patent Grant
Method and microscope for high spatial resolution examination of sa...
- Patent number 7,903,247
- Issue date Mar 8, 2011
- Leica Microsystems CMS GmbH
- Marcus Dyba
- G01 - MEASURING TESTING
Information Patent Grant
Method for high spatial resolution examination of samples
- Patent number 7,830,506
- Issue date Nov 9, 2010
- Leica Microsystems CMS GmbH
- Hilmar Gugel
- G01 - MEASURING TESTING
Information Patent Grant
Method and microscope for high spatial resolution examination of sa...
- Patent number 7,679,741
- Issue date Mar 16, 2010
- Leica Microsystems CMS GmbH
- Marcus Dyba
- G02 - OPTICS
Information Patent Grant
Method and microscope for high spatial resolution examination of sa...
- Patent number 7,646,481
- Issue date Jan 12, 2010
- Leica Microsystems CMS GmbH
- Marcus Dyba
- G01 - MEASURING TESTING
Information Patent Grant
Method and microscope for high spatial resolution examination of sa...
- Patent number 7,619,732
- Issue date Nov 17, 2009
- Leica Microsystems CMS GmbH
- Hilmar Gugel
- G02 - OPTICS

Patents Applicationslast 30 patents

Information Patent Application
SINGLE-PARTICLE LOCALIZATION MICROSCOPE
- Publication number 20240361584
- Publication date Oct 31, 2024
- Leica Microsystems CMS GmbH
- Gabriel SIRAT
- G01 - MEASURING TESTING
Information Patent Application
SINGLE-PARTICLE LOCALIZATION MICROSCOPE
- Publication number 20230236401
- Publication date Jul 27, 2023
- Leica Microsystems CMS GmbH
- Marcus DYBA
- G01 - MEASURING TESTING
Information Patent Application
IMAGE PROCESSING SYSTEM
- Publication number 20230196531
- Publication date Jun 22, 2023
- Leica Microsystems CMS GmbH
- Marcus DYBA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SCANNING DEVICE FOR SCANNING AN OBJECT FOR USE IN A SCANNING MICROS...
- Publication number 20190064494
- Publication date Feb 28, 2019
- Leica Microsystems CMS GmbH
- Marcus Dyba
- G02 - OPTICS
Information Patent Application
DEVICE AND METHOD FOR DETECTING LIGHT
- Publication number 20180039053
- Publication date Feb 8, 2018
- Manuel Kremer
- G02 - OPTICS
Information Patent Application
METHOD FOR IMPROVING THE DYNAMIC RANGE OF A DEVICE FOR DETECTING LIGHT
- Publication number 20180031420
- Publication date Feb 1, 2018
- Leica Microsystems CMS GmbH
- Marcus Dyba
- G02 - OPTICS
Information Patent Application
MICROSCOPIC DEVICE AND MICROSCOPIC METHOD FOR THE THREE-DIMENSIONAL...
- Publication number 20130229494
- Publication date Sep 5, 2013
- Leica Microsystems CMS GmbH
- Marcus Dyba
- G02 - OPTICS
Information Patent Application
Method and Device for Light-Microscopic Imaging of a Sample Structure
- Publication number 20130222568
- Publication date Aug 29, 2013
- Leica Microsystems CMS GmbH
- Marcus Dyba
- G02 - OPTICS
Information Patent Application
Device and Method for Acquiring a Microscopic Image of a Sample Str...
- Publication number 20130128025
- Publication date May 23, 2013
- Leica Microsystems CMS GmbH
- Marcus Dyba
- G02 - OPTICS
Information Patent Application
Sample Holder For A Microscope
- Publication number 20130033744
- Publication date Feb 7, 2013
- Leica Microsystems CMS GmbH
- Jonas Fölling
- G02 - OPTICS
Information Patent Application
Phase Filters for a Scanning Microscope
- Publication number 20120236398
- Publication date Sep 20, 2012
- Leica Microsystems CMS GmbH
- Hilmar GUGEL
- G02 - OPTICS
Information Patent Application
DEVICE AND METHOD FOR PROVIDING A PREDETERMINABLE CONCENTRATION OF...
- Publication number 20100122588
- Publication date May 20, 2010
- Leica Microsystems CMS GmbH
- Jochen Sieber
- G05 - CONTROLLING REGULATING
Information Patent Application
LASER MICROSCOPE WITH A PHYSICALLY SEPARATING BEAM SPLITTER
- Publication number 20090323058
- Publication date Dec 31, 2009
- Leica Microsystems CMS GmbH
- Marcus Dyba
- G02 - OPTICS
Information Patent Application
METHOD AND MICROSCOPE FOR HIGH SPATIAL RESOLUTION EXAMINATION OF SA...
- Publication number 20090303474
- Publication date Dec 10, 2009
- Leica Microsystems CMS GmbH
- Marcus DYBA
- G02 - OPTICS
Information Patent Application
Device and method for beam adjustment in an optical beam path
- Publication number 20080316469
- Publication date Dec 25, 2008
- Leica Microsystems CMS GmbH
- Holger Birk
- G02 - OPTICS
Information Patent Application
METHOD AND MICROSCOPE FOR HIGH SPATIAL RESOLUTION EXAMINATION OF SA...
- Publication number 20070268583
- Publication date Nov 22, 2007
- Leica Microsystems CMS GmbH
- Marcus DYBA
- G02 - OPTICS
Information Patent Application
Method for high spatial resolution examination of samples
- Publication number 20070206277
- Publication date Sep 6, 2007
- Leica Microsystems CMS GmbH
- Hilmar Gugel
- G01 - MEASURING TESTING
Information Patent Application
Method and microscope for high spatial resolution examination of sa...
- Publication number 20070206278
- Publication date Sep 6, 2007
- Leica Microsystems CMS GmbH
- Marcus DYBA
- G02 - OPTICS
Information Patent Application
METHOD AND MICROSCOPE FOR HIGH SPATIAL RESOLUTION EXAMINATION OF SA...
- Publication number 20070206276
- Publication date Sep 6, 2007
- Leica Microsystems CMS GmbH
- Hilmar GUGEL
- G02 - OPTICS

Marcus DYBA

Person

Patents Grantslast 30 patents

Image processing system

Scanning device for scanning an object for use in a scanning micros...

Device and method for detecting light using a silicon photomultipli...

Method for improving the dynamic range of a device for detecting light

Method and device for light-microscopic imaging of a sample structure

Device and method for acquiring a microscopic image of a sample str...

Microscopic device and microscopic method for the three-dimensional...

Phase filters for a scanning microscope

Sample holder for a microscope

Device and method for providing a predeterminable concentration of...

Device and method for beam adjustment in an optical beam path

Laser microscope with a physically separating beam splitter

Method and microscope for high spatial resolution examination of sa...

Method for high spatial resolution examination of samples

Method and microscope for high spatial resolution examination of sa...

Method and microscope for high spatial resolution examination of sa...

Method and microscope for high spatial resolution examination of sa...

Patents Applicationslast 30 patents

SINGLE-PARTICLE LOCALIZATION MICROSCOPE

SINGLE-PARTICLE LOCALIZATION MICROSCOPE

IMAGE PROCESSING SYSTEM

SCANNING DEVICE FOR SCANNING AN OBJECT FOR USE IN A SCANNING MICROS...

DEVICE AND METHOD FOR DETECTING LIGHT

METHOD FOR IMPROVING THE DYNAMIC RANGE OF A DEVICE FOR DETECTING LIGHT

MICROSCOPIC DEVICE AND MICROSCOPIC METHOD FOR THE THREE-DIMENSIONAL...

Method and Device for Light-Microscopic Imaging of a Sample Structure

Device and Method for Acquiring a Microscopic Image of a Sample Str...

Sample Holder For A Microscope

Phase Filters for a Scanning Microscope

DEVICE AND METHOD FOR PROVIDING A PREDETERMINABLE CONCENTRATION OF...

LASER MICROSCOPE WITH A PHYSICALLY SEPARATING BEAM SPLITTER

METHOD AND MICROSCOPE FOR HIGH SPATIAL RESOLUTION EXAMINATION OF SA...

Device and method for beam adjustment in an optical beam path

METHOD AND MICROSCOPE FOR HIGH SPATIAL RESOLUTION EXAMINATION OF SA...

Method for high spatial resolution examination of samples

Method and microscope for high spatial resolution examination of sa...

METHOD AND MICROSCOPE FOR HIGH SPATIAL RESOLUTION EXAMINATION OF SA...