Marcus Johannes VAN DER LANS

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Hillegom, NL

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Patents Grantslast 30 patents

Information Patent Grant
Heterodyne scanning probe microscopy method and scanning probe micr...
- Patent number 11,635,448
- Issue date Apr 25, 2023
- Nederlandse Organisatie voor toegepast-natuurwetenschappelijk onderzoek TNO
- Sri Ram Shankar Rajadurai
- G01 - MEASURING TESTING
Information Patent Grant
Atomic force microscopy system, method for mapping one or more subs...
- Patent number 11,035,878
- Issue date Jun 15, 2021
- Nederlandse Organisatie voor toegepast-natuurwetenschappelijk onderzoek TNO
- Laurent Fillinger
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SYSTEMS AND METHODS FOR THERMALLY STABLE MOUNTING OF OPTICAL COLUMNS
- Publication number 20240329548
- Publication date Oct 3, 2024
- ASML NETHERLANDS B.V.
- Jasper WINTERS
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
SYSTEMS AND METHODS FOR DISTRIBUTING LIGHT DELIVERY
- Publication number 20240160110
- Publication date May 16, 2024
- ASML NETHERLANDS B.V.
- Jasper WINTERS
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
HETERODYNE SCANNING PROBE MICROSCOPY METHOD AND SCANNING PROBE MICR...
- Publication number 20220229088
- Publication date Jul 21, 2022
- NEDERLANDSE ORGANISATIE VOOR TOEGEPAST- NATUURWETENSCHAPPELIJK ONDERZOEK TNO
- Sri Ram Shankar RAJADURAI
- G01 - MEASURING TESTING
Information Patent Application
ATOMIC FORCE MICROSCOPY SYSTEM, METHOD FOR MAPPING ONE OR MORE SUBS...
- Publication number 20200309816
- Publication date Oct 1, 2020
- NEDERLANDSE ORGANISATIE VOOR TOEGEPAST- NATUURWETENSCHAPPELIJK ONDERZOEK TNO
- Laurent FILLINGER
- G01 - MEASURING TESTING