Marcus Straw

Person

Portland, OR, US

People

Patents Grantslast 30 patents

Information Patent Grant
System and method for preparation and delivery of biological sample...
- Patent number 12,165,839
- Issue date Dec 10, 2024
- FEI Company
- Marcus Straw
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Reconstruction algorithms of electron-based holograms
- Patent number 11,782,385
- Issue date Oct 10, 2023
- FEI Company
- Kun Liu
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
System and method for preparation and delivery of biological sample...
- Patent number 11,749,498
- Issue date Sep 5, 2023
- FEI Company
- Marcus Straw
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System and method for preparation and delivery of biological sample...
- Patent number 11,217,425
- Issue date Jan 4, 2022
- FEI Company
- Marcus Straw
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for laser machining
- Patent number 10,493,559
- Issue date Dec 3, 2019
- FEI Company
- Marcus Straw
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Seed layer laser-induced deposition
- Patent number 10,023,955
- Issue date Jul 17, 2018
- FEI Company
- Steven Randolph
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Method for coincident alignment of a laser beam and a charged parti...
- Patent number 9,754,764
- Issue date Sep 5, 2017
- FEI Company
- Marcus Straw
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Environmental cell for charged particle beam system
- Patent number 9,679,741
- Issue date Jun 13, 2017
- FEI Company
- Libor Novak
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Integrated light optics and gas delivery in a charged particle lens
- Patent number 9,478,390
- Issue date Oct 25, 2016
- FEI Company
- N. William Parker
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Fiducial-based correlative microscopy
- Patent number 9,368,321
- Issue date Jun 14, 2016
- FEI Company
- Steven Randolph
- G01 - MEASURING TESTING
Information Patent Grant
Charged-particle lens that transmits emissions from sample
- Patent number 9,349,564
- Issue date May 24, 2016
- FEI Company
- N. William Parker
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for coincident alignment of a laser beam and a charged parti...
- Patent number 9,263,235
- Issue date Feb 16, 2016
- FEI Company
- Marcus Straw
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
System for protecting light optical components during laser ablation
- Patent number 9,216,475
- Issue date Dec 22, 2015
- FEI Company
- Marcus Straw
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Method for laser machining a sample having a crystalline structure
- Patent number 8,853,592
- Issue date Oct 7, 2014
- FEI Company
- Marcus Straw
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Automated method for coincident alignment of a laser beam and a cha...
- Patent number 8,766,213
- Issue date Jul 1, 2014
- FEI Company
- Marcus Straw
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Charged particle beam masking for laser ablation micromachining
- Patent number 8,629,416
- Issue date Jan 14, 2014
- FEI Company
- Marcus Straw
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Gas-assisted laser ablation
- Patent number 8,524,139
- Issue date Sep 3, 2013
- FEI Compay
- Milos Toth
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Combination laser and charged particle beam system
- Patent number 8,314,410
- Issue date Nov 20, 2012
- FEI Company
- Marcus Straw
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam masking for laser ablation micromachining
- Patent number 8,168,961
- Issue date May 1, 2012
- FEI Company
- Marcus Straw
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR

Patents Applicationslast 30 patents

Information Patent Application
SYSTEM AND METHOD FOR PREPARATION AND DELIVERY OF BIOLOGICAL SAMPLE...
- Publication number 20240021407
- Publication date Jan 18, 2024
- FEI Company
- Marcus Straw
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEM AND METHOD FOR PREPARATION AND DELIVERY OF BIOLOGICAL SAMPLE...
- Publication number 20220115205
- Publication date Apr 14, 2022
- FEI Company
- Marcus Straw
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
RECONSTRUCTION ALGORITHMS OF ELECTRON-BASED HOLOGRAMS
- Publication number 20210181676
- Publication date Jun 17, 2021
- FEI Company
- Kun Liu
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
SYSTEM AND METHOD FOR PREPARATION AND DELIVERY OF BIOLOGICAL SAMPLE...
- Publication number 20200411282
- Publication date Dec 31, 2020
- FEI Company
- Marcus Straw
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEED LAYER LASER-INDUCED DEPOSITION
- Publication number 20180298490
- Publication date Oct 18, 2018
- FEI Company
- Steven Randolph
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
ADAPTIVE CONTROL FOR CHARGED PARTICLE BEAM PROCESSING
- Publication number 20170002467
- Publication date Jan 5, 2017
- FEI Company
- Marcus Straw
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
FIDUCIAL-BASED CORRELATIVE MICROSCOPY
- Publication number 20160181060
- Publication date Jun 23, 2016
- FEI Company
- Steven Randolph
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR COINCIDENT ALIGNMENT OF A LASER BEAM AND A CHARGED PARTI...
- Publication number 20160126059
- Publication date May 5, 2016
- FEI Company
- Marcus Straw
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged-Particle Lens that Transmits Emissions from Sample
- Publication number 20160020062
- Publication date Jan 21, 2016
- FEI Company
- N. William Parker
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR COINCIDENT ALIGNMENT OF A LASER BEAM AND A CHARGED PARTI...
- Publication number 20150060660
- Publication date Mar 5, 2015
- FEI Company
- Marcus Straw
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
System for Protecting Light Optical Components during Laser Ablation
- Publication number 20140291305
- Publication date Oct 2, 2014
- Marcus Straw
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
Automated Method for Coincident Alignment of a Laser Beam and a Cha...
- Publication number 20140070113
- Publication date Mar 13, 2014
- FEI Company
- Marcus Straw
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
Seed Layer Laser-Induced Deposition
- Publication number 20140065319
- Publication date Mar 6, 2014
- FEI Company
- Steven Randolph
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
GAS-ASSISTED LASER ABLATION
- Publication number 20140054267
- Publication date Feb 27, 2014
- FEI Company
- Milos Toth
- B41 - PRINTING LINING MACHINES TYPEWRITERS STAMPS
Information Patent Application
Charged Particle Beam Masking for Laser Ablation Micromachining
- Publication number 20120200007
- Publication date Aug 9, 2012
- FEI Company
- MARCUS STRAW
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
Environmental Cell for Charged Particle Beam System
- Publication number 20120112062
- Publication date May 10, 2012
- FEI Company
- Libor Novak
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method And Apparatus For Laser Machining
- Publication number 20120103945
- Publication date May 3, 2012
- FEI Company
- Marcus Straw
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
Combination Laser and Charged Particle Beam System
- Publication number 20110248164
- Publication date Oct 13, 2011
- FEI Company
- Marcus Straw
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method and Apparatus for Laser Machining
- Publication number 20110115129
- Publication date May 19, 2011
- FEI Company
- Marcus Straw
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
GAS-ASSISTED LASER ABLATION
- Publication number 20110031655
- Publication date Feb 10, 2011
- FEI Company
- Milos Toth
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
CHARGED PARTICLE BEAM MASKING FOR LASER ABLATION MICROMACHINING
- Publication number 20100127190
- Publication date May 27, 2010
- FEI Company
- MARCUS STRAW
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR

Marcus Straw

Person

Patents Grantslast 30 patents

System and method for preparation and delivery of biological sample...

Reconstruction algorithms of electron-based holograms

System and method for preparation and delivery of biological sample...

System and method for preparation and delivery of biological sample...

Method and apparatus for laser machining

Seed layer laser-induced deposition

Method for coincident alignment of a laser beam and a charged parti...

Environmental cell for charged particle beam system

Integrated light optics and gas delivery in a charged particle lens

Fiducial-based correlative microscopy

Charged-particle lens that transmits emissions from sample

Method for coincident alignment of a laser beam and a charged parti...

System for protecting light optical components during laser ablation

Method for laser machining a sample having a crystalline structure

Automated method for coincident alignment of a laser beam and a cha...

Charged particle beam masking for laser ablation micromachining

Gas-assisted laser ablation

Combination laser and charged particle beam system

Charged particle beam masking for laser ablation micromachining

Patents Applicationslast 30 patents

SYSTEM AND METHOD FOR PREPARATION AND DELIVERY OF BIOLOGICAL SAMPLE...

SYSTEM AND METHOD FOR PREPARATION AND DELIVERY OF BIOLOGICAL SAMPLE...

RECONSTRUCTION ALGORITHMS OF ELECTRON-BASED HOLOGRAMS

SYSTEM AND METHOD FOR PREPARATION AND DELIVERY OF BIOLOGICAL SAMPLE...

SEED LAYER LASER-INDUCED DEPOSITION

ADAPTIVE CONTROL FOR CHARGED PARTICLE BEAM PROCESSING

FIDUCIAL-BASED CORRELATIVE MICROSCOPY

METHOD FOR COINCIDENT ALIGNMENT OF A LASER BEAM AND A CHARGED PARTI...

Charged-Particle Lens that Transmits Emissions from Sample

METHOD FOR COINCIDENT ALIGNMENT OF A LASER BEAM AND A CHARGED PARTI...

System for Protecting Light Optical Components during Laser Ablation

Automated Method for Coincident Alignment of a Laser Beam and a Cha...

Seed Layer Laser-Induced Deposition

GAS-ASSISTED LASER ABLATION

Charged Particle Beam Masking for Laser Ablation Micromachining

Environmental Cell for Charged Particle Beam System

Method And Apparatus For Laser Machining

Combination Laser and Charged Particle Beam System

Method and Apparatus for Laser Machining

GAS-ASSISTED LASER ABLATION

CHARGED PARTICLE BEAM MASKING FOR LASER ABLATION MICROMACHINING