Marek Uncovsky

Person

Brno, CZ

People

Patents Grantslast 30 patents

Information Patent Grant
Light guide assembly for an electron microscope
- Patent number 11,335,536
- Issue date May 17, 2022
- FEI Company
- Marek Uncovsky
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Measurement and endpointing of sample thickness
- Patent number 10,978,272
- Issue date Apr 13, 2021
- FEI Company
- Tomas Vystavel
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Arrangement for X-Ray tomography
- Patent number 9,958,403
- Issue date May 1, 2018
- FEI Company
- Pavel Stejskal
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Environmental cell for charged particle beam system
- Patent number 9,679,741
- Issue date Jun 13, 2017
- FEI Company
- Libor Novak
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of acquiring EBSP patterns
- Patent number 9,618,463
- Issue date Apr 11, 2017
- FEI Company
- Marek Uncovský
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Detection method for use in charged-particle microscopy
- Patent number 9,153,416
- Issue date Oct 6, 2015
- FEI Company
- Petr Hlavenka
- G01 - MEASURING TESTING
Information Patent Grant
Detector for use in charged-particle microscopy
- Patent number 8,735,849
- Issue date May 27, 2014
- FEI Company
- Petr Hlavenka
- G01 - MEASURING TESTING
Information Patent Grant
Multistage gas cascade amplifier
- Patent number 7,791,020
- Issue date Sep 7, 2010
- FEI Company
- Marek Uncovsky
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Particle detector suitable for detecting ions and electrons
- Patent number 7,009,187
- Issue date Mar 7, 2006
- FEI Company
- Robert L. Gerlach
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
INERT GAS SAMPLE TRANSFER FOR BEAM SYSTEMS
- Publication number 20230245850
- Publication date Aug 3, 2023
- FEI Company
- Libor Novák
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
LIGHT GUIDE ASSEMBLY FOR AN ELECTRON MICROSCOPE
- Publication number 20210082659
- Publication date Mar 18, 2021
- FEI Company
- Marek Uncovsky
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MEASUREMENT AND ENDPOINTING OF SAMPLE THICKNESS
- Publication number 20200135427
- Publication date Apr 30, 2020
- FEI Company
- Tomás Vystavel
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ARRANGEMENT FOR X-RAY TOMOGRAPHY
- Publication number 20180100815
- Publication date Apr 12, 2018
- FEI Company
- Pavel Stejskal
- G01 - MEASURING TESTING
Information Patent Application
CHARGED-PARTICLE MICROSCOPE WITH EXCHANGEABLE POLE PIECE EXTENDING...
- Publication number 20180061613
- Publication date Mar 1, 2018
- FEI Company
- Bohuslav Sed'a
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INVESTIGATION OF HIGH-TEMPERATURE SPECIMENS IN A CHARGED PARTICLE M...
- Publication number 20170103868
- Publication date Apr 13, 2017
- FEI Company
- Libor Novak
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF ACQUIRING EBSP PATTERNS
- Publication number 20160054240
- Publication date Feb 25, 2016
- FEI Company
- Marek Uncovský
- G01 - MEASURING TESTING
Information Patent Application
DETECTION METHOD FOR USE IN CHARGED-PARTICLE MICROSCOPY
- Publication number 20140374593
- Publication date Dec 25, 2014
- FEI Company
- Petr Hlavenka
- G01 - MEASURING TESTING
Information Patent Application
Detector for Use in Charged-Particle Microscopy
- Publication number 20120205539
- Publication date Aug 16, 2012
- FEI Company
- Petr Hlavenka
- G01 - MEASURING TESTING
Information Patent Application
Environmental Cell for Charged Particle Beam System
- Publication number 20120112062
- Publication date May 10, 2012
- FEI Company
- Libor Novak
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MULTISTAGE GAS CASCADE AMPLIFIER
- Publication number 20090242758
- Publication date Oct 1, 2009
- FEI Company
- MAREK UNCOVSKY
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Particle detector suitable for detecting ions and electrons
- Publication number 20040262531
- Publication date Dec 30, 2004
- Robert L. Gerlach
- H01 - BASIC ELECTRIC ELEMENTS

Marek Uncovsky

Person

Patents Grantslast 30 patents

Light guide assembly for an electron microscope

Measurement and endpointing of sample thickness

Arrangement for X-Ray tomography

Environmental cell for charged particle beam system

Method of acquiring EBSP patterns

Detection method for use in charged-particle microscopy

Detector for use in charged-particle microscopy

Multistage gas cascade amplifier

Particle detector suitable for detecting ions and electrons

Patents Applicationslast 30 patents

INERT GAS SAMPLE TRANSFER FOR BEAM SYSTEMS

LIGHT GUIDE ASSEMBLY FOR AN ELECTRON MICROSCOPE

MEASUREMENT AND ENDPOINTING OF SAMPLE THICKNESS

ARRANGEMENT FOR X-RAY TOMOGRAPHY

CHARGED-PARTICLE MICROSCOPE WITH EXCHANGEABLE POLE PIECE EXTENDING...

INVESTIGATION OF HIGH-TEMPERATURE SPECIMENS IN A CHARGED PARTICLE M...

METHOD OF ACQUIRING EBSP PATTERNS

DETECTION METHOD FOR USE IN CHARGED-PARTICLE MICROSCOPY

Detector for Use in Charged-Particle Microscopy

Environmental Cell for Charged Particle Beam System

MULTISTAGE GAS CASCADE AMPLIFIER

Particle detector suitable for detecting ions and electrons