Margaret L. Kniffin

Person

Chandler, AZ, US

People

Patents Grantslast 30 patents

Information Patent Grant
Methods and systems for electrically calibrating transducers
- Patent number 10,578,641
- Issue date Mar 3, 2020
- NXP USA, INC.
- Margaret Leslie Kniffin
- G01 - MEASURING TESTING
Information Patent Grant
Segmented electrode structure for quadrature reduction in an integr...
- Patent number 10,330,475
- Issue date Jun 25, 2019
- NXP USA, INC.
- Thierry Cassagnes
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Multi-axis inertial sensor with dual mass and integrated damping st...
- Patent number 9,720,012
- Issue date Aug 1, 2017
- NXP USA, INC.
- Jun Tang
- G01 - MEASURING TESTING
Information Patent Grant
System and method for calibrating an inertial sensor
- Patent number 9,500,669
- Issue date Nov 22, 2016
- FREESCALE SEMICONDUCTOR, INC.
- Margaret L. Kniffin
- G01 - MEASURING TESTING
Information Patent Grant
MEMS device with differential vertical sense electrodes
- Patent number 9,346,670
- Issue date May 24, 2016
- Freescale Semiconductor Inc.
- Aaron A. Geisberger
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
MEMS device with differential vertical sense electrodes
- Patent number 9,242,851
- Issue date Jan 26, 2016
- FREESCALE SEMICONDUCTOR, INC.
- Aaron A. Geisberger
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Methods and apparatus for simulating distributed effects
- Patent number 7,530,039
- Issue date May 5, 2009
- FREESCALE SEMICONDUCTOR, INC.
- Margaret L. Kniffin
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Sensor and method of fabrication
- Patent number 6,326,228
- Issue date Dec 4, 2001
- Motorola, Inc.
- Henry G. Hughes
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor floating gate sensor device
- Patent number 5,929,472
- Issue date Jul 27, 1999
- Motorola, Inc.
- Margaret L. Kniffin
- G01 - MEASURING TESTING
Information Patent Grant
Carboxylic acid etching solution and method
- Patent number 5,824,601
- Issue date Oct 20, 1998
- Motorola, Inc.
- Patrick P. H. Dao
- C09 - DYES PAINTS POLISHES NATURAL RESINS ADHESIVES MISCELLANEOUS COMPOSITION...
Information Patent Grant
Semiconductor device having a movable gate
- Patent number 5,818,093
- Issue date Oct 6, 1998
- Motorola, Inc.
- Ronald J. Gutteridge
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHODS AND SYSTEMS FOR ELECTRICALLY CALIBRATING TRANSDUCERS
- Publication number 20180052185
- Publication date Feb 22, 2018
- Freescale Semiconductor Inc.
- MARGARET LESLIE KNIFFIN
- G01 - MEASURING TESTING
Information Patent Application
SEGMENTED ELECTRODE STRUCTURE FOR QUADRATURE REDUCTION IN AN INTEGR...
- Publication number 20180017387
- Publication date Jan 18, 2018
- NXP USA, Inc.
- Thierry Cassagnes
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
MULTI-AXIS INERTIAL SENSOR WITH DUAL MASS AND INTEGRATED DAMPING ST...
- Publication number 20170023608
- Publication date Jan 26, 2017
- FREESCALE SEMICONDUCTOR, INC.
- JUN TANG
- G01 - MEASURING TESTING
Information Patent Application
MEMS SENSOR DEVICES HAVING A SELF-TEST MODE
- Publication number 20170003315
- Publication date Jan 5, 2017
- FREESCALE SEMICONDUCTOR, INC.
- JEROME ROMAIN ENJALBERT
- G01 - MEASURING TESTING
Information Patent Application
MEMS DEVICE WITH DIFFERENTIAL VERTICAL SENSE ELECTRODES
- Publication number 20160083249
- Publication date Mar 24, 2016
- FREESCALE SEMICONDUCTOR, INC.
- Aaron A. Geisberger
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
SYSTEM AND METHOD FOR CALIBRATING AN INERTIAL SENSOR
- Publication number 20150198628
- Publication date Jul 16, 2015
- FREESCALE SEMICONDUCTOR, INC.
- Margaret L. Kniffin
- G01 - MEASURING TESTING
Information Patent Application
MEMS DEVICE WITH DIFFERENTIAL VERTICAL SENSE ELECTRODES
- Publication number 20150041927
- Publication date Feb 12, 2015
- FREESCALE SEMICONDUCTOR, INC.
- Aaron A. Geisberger
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
METHOD AND SYSTEM FOR CALIBRATING AN INERTIAL SENSOR
- Publication number 20140074418
- Publication date Mar 13, 2014
- FREESCALE SEMICONDUCTOR, INC.
- Yizhen Lin
- G01 - MEASURING TESTING
Information Patent Application
Methods and apparatus for simulating distributed effects
- Publication number 20070288882
- Publication date Dec 13, 2007
- Margaret L. Kniffin
- G06 - COMPUTING CALCULATING COUNTING

Margaret L. Kniffin

Person

Patents Grantslast 30 patents

Methods and systems for electrically calibrating transducers

Segmented electrode structure for quadrature reduction in an integr...

Multi-axis inertial sensor with dual mass and integrated damping st...

System and method for calibrating an inertial sensor

MEMS device with differential vertical sense electrodes

MEMS device with differential vertical sense electrodes

Methods and apparatus for simulating distributed effects

Sensor and method of fabrication

Semiconductor floating gate sensor device

Carboxylic acid etching solution and method

Semiconductor device having a movable gate

Patents Applicationslast 30 patents

METHODS AND SYSTEMS FOR ELECTRICALLY CALIBRATING TRANSDUCERS

SEGMENTED ELECTRODE STRUCTURE FOR QUADRATURE REDUCTION IN AN INTEGR...

MULTI-AXIS INERTIAL SENSOR WITH DUAL MASS AND INTEGRATED DAMPING ST...

MEMS SENSOR DEVICES HAVING A SELF-TEST MODE

MEMS DEVICE WITH DIFFERENTIAL VERTICAL SENSE ELECTRODES

SYSTEM AND METHOD FOR CALIBRATING AN INERTIAL SENSOR

MEMS DEVICE WITH DIFFERENTIAL VERTICAL SENSE ELECTRODES

METHOD AND SYSTEM FOR CALIBRATING AN INERTIAL SENSOR

Methods and apparatus for simulating distributed effects