Maria A. Hozbor

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San Jose, CA, US

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Patents Applicationslast 30 patents

Information Patent Application
System and method for examination of microarrays using scanning ele...
- Publication number 20050009055
- Publication date Jan 13, 2005
- AFFYMETRIX, INC.
- Paul C. Ciccolella
- G01 - MEASURING TESTING
Information Patent Application
Systems and method for examination of microarrays using scanning el...
- Publication number 20040081985
- Publication date Apr 29, 2004
- AFFYMETRIX, INC.
- Paul C. Ciccolella
- G01 - MEASURING TESTING