Marian Mankos

Person

San Francisco, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Systems, devices, and methods for performing a non-contact electric...
- Patent number 12,038,476
- Issue date Jul 16, 2024
- PDF Solutions, Inc.
- Indranil De
- G01 - MEASURING TESTING
Information Patent Grant
Systems, devices, and methods for performing a non-contact electric...
- Patent number 11,668,746
- Issue date Jun 6, 2023
- PDF Solutions, Inc.
- Indranil De
- G01 - MEASURING TESTING
Information Patent Grant
Aberration reduction in multipass electron microscopy
- Patent number 11,456,148
- Issue date Sep 27, 2022
- The Board of Trustees of the Leland Stanford Junior University
- Mark A. Kasevich
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods for performing a non-contact electrical measurement on a ce...
- Patent number 11,340,293
- Issue date May 24, 2022
- PDF Solutions, Inc.
- Indranil De
- G01 - MEASURING TESTING
Information Patent Grant
Compact arrangement for aberration correction of electron lenses
- Patent number 11,276,549
- Issue date Mar 15, 2022
- Marian Mankos
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
E-beam inspection apparatus and method of using the same on various...
- Patent number 9,496,119
- Issue date Nov 15, 2016
- PDF Solutions, Inc.
- Indranil De
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mirror pulse compressor for electron beam apparatus
- Patent number 9,406,479
- Issue date Aug 2, 2016
- Electron Optica, Inc.
- Marian Mankos
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Aberration-corrected and energy-filtered low energy electron micros...
- Patent number 8,729,466
- Issue date May 20, 2014
- Electron Optica, Inc.
- Marian Mankos
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron beam column and methods of using same
- Patent number 8,461,526
- Issue date Jun 11, 2013
- KLA-Tencor Corporation
- Marian Mankos
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mirror energy filter for electron beam apparatus
- Patent number 8,334,508
- Issue date Dec 18, 2012
- Electron Optica, Inc.
- Marian Mankos
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
High-sensitivity and high-throughput electron beam inspection colum...
- Patent number 8,294,125
- Issue date Oct 23, 2012
- KLA-Tencor Corporation
- Liqun Han
- G01 - MEASURING TESTING
Information Patent Grant
Compact arrangement for dual-beam low energy electron microscope
- Patent number 8,258,474
- Issue date Sep 4, 2012
- Electron Optica, Inc.
- Marian Mankos
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mirror monochromator for charged particle beam apparatus
- Patent number 8,183,526
- Issue date May 22, 2012
- Electron Optica
- Marian Mankos
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Shielding, particulate reducing high vacuum components
- Patent number 8,092,927
- Issue date Jan 10, 2012
- KLA-Tencor Corporation
- Mohammed Tahmassebpur
- C22 - METALLURGY FERROUS OR NON-FERROUS ALLOYS TREATMENT OF ALLOYS OR NON-FER...
Information Patent Grant
Shielding, particulate reducing high vacuum components
- Patent number 7,919,193
- Issue date Apr 5, 2011
- KLA-Tencor Corporation
- Mohammed Tahmassebpur
- C22 - METALLURGY FERROUS OR NON-FERROUS ALLOYS TREATMENT OF ALLOYS OR NON-FER...
Information Patent Grant
Electron beam apparatus and inspection method using dual illuminati...
- Patent number 7,838,832
- Issue date Nov 23, 2010
- KLA-Tencor Corporation
- Marian Mankos
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Immersion gun equipped electron beam column
- Patent number 7,821,187
- Issue date Oct 26, 2010
- KLA-Tencor Corporation
- Xinrong Jiang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Reflective electron patterning device and method of using same
- Patent number 7,816,655
- Issue date Oct 19, 2010
- KLA-Tencor Technologies Corporation
- Harald F. Hess
- B82 - NANO-TECHNOLOGY
Information Patent Grant
High-fidelity reflection electron beam lithography
- Patent number 7,692,167
- Issue date Apr 6, 2010
- KLA-Tencor Technologies Corporation
- Marian Mankos
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
High-resolution, low-distortion and high-efficiency optical couplin...
- Patent number 7,566,873
- Issue date Jul 28, 2009
- KLA-Tencor Technologies Corporation
- David Walker
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electrical process monitoring using mirror-mode electron microscopy
- Patent number 7,514,681
- Issue date Apr 7, 2009
- KLA-Tencor Technologies Corporation
- Paul F. Marella
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Systems, control subsystems, and methods for projecting an electron...
- Patent number 7,342,238
- Issue date Mar 11, 2008
- KLA-Tenor Technologies Corp.
- Marek Zywno
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Holey mirror arrangement for dual-energy e-beam inspector
- Patent number 7,217,924
- Issue date May 15, 2007
- KLA-Tencor Technologies Corporation
- Marian Mankos
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Scanning electron microscope with curved axes
- Patent number 7,205,542
- Issue date Apr 17, 2007
- KLA-Tencor Technologies Corporation
- Marian Mankos
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron beam lithography system having improved electron gun
- Patent number 7,095,037
- Issue date Aug 22, 2006
- Andres Fernadez
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus and method for tilted particle-beam illumination
- Patent number 7,009,177
- Issue date Mar 7, 2006
- KLA-Tencor Technologies Corporation
- Marian Mankos
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Twisted-compensated low-energy electron microscope
- Patent number 6,943,360
- Issue date Sep 13, 2005
- KLA-Tencor Technologies Corporation
- Marian Mankos
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
High contrast inspection and review of magnetic media and heads
- Patent number 6,936,816
- Issue date Aug 30, 2005
- KLA-Tencor Technologies Corporation
- Marian Mankos
- G11 - INFORMATION STORAGE
Information Patent Grant
Dual-energy electron flooding for neutralization of charged substrate
- Patent number 6,930,309
- Issue date Aug 16, 2005
- KLA-Tencor Technologies Corporation
- Marian Mankos
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for reducing substrate edge effects in electro...
- Patent number 6,903,338
- Issue date Jun 7, 2005
- KLA-Tencor Technologies Corporation
- Marian Mankos
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
SYSTEMS, DEVICES, AND METHODS FOR PERFORMING A NON-CONTACT ELECTRIC...
- Publication number 20240329128
- Publication date Oct 3, 2024
- PDF Solutions, Inc.
- Indranil DE
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS, DEVICES, AND METHODS FOR PERFORMING A NON-CONTACT ELECTRIC...
- Publication number 20230358804
- Publication date Nov 9, 2023
- PDF Solutions, Inc.
- Indranil DE
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS, DEVICES, AND METHODS FOR PERFORMING A NON-CONTACT ELECTRIC...
- Publication number 20220365134
- Publication date Nov 17, 2022
- PDF SOLUTIONS, INC.
- Indranil DE
- G01 - MEASURING TESTING
Information Patent Application
Aberration reduction in multipass electron microscopy
- Publication number 20210217578
- Publication date Jul 15, 2021
- The Board of Trustees of the Leland Stanford Junior University
- Mark A. KASEVICH
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEMS, DEVICES, AND METHODS FOR PERFORMING A NON-CONTACT ELECTRIC...
- Publication number 20210096179
- Publication date Apr 1, 2021
- Indranil DE
- G01 - MEASURING TESTING
Information Patent Application
ELECTRON BEAM COLUMN AND METHODS OF USING SAME
- Publication number 20120138791
- Publication date Jun 7, 2012
- Marian MANKOS
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Shielding, Particulate Reducing High Vacuum Components
- Publication number 20110142382
- Publication date Jun 16, 2011
- KLA-Tencor Technologies Corporation
- Mohammed Tahmassebpur
- C22 - METALLURGY FERROUS OR NON-FERROUS ALLOYS TREATMENT OF ALLOYS OR NON-FER...
Information Patent Application
High-Sensitivity and High-Throughput Electron Beam Inspection Colum...
- Publication number 20110114838
- Publication date May 19, 2011
- Liqun HAN
- G01 - MEASURING TESTING
Information Patent Application
Systems, control subsystems, and methods for projecting an electron...
- Publication number 20070029506
- Publication date Feb 8, 2007
- Marek Zywno
- B82 - NANO-TECHNOLOGY
Information Patent Application
Electron beam lithography system having improved electron gun
- Publication number 20040232357
- Publication date Nov 25, 2004
- Andres Fernadez
- B82 - NANO-TECHNOLOGY
Information Patent Application
High contrast inspection and review of magnetic media and heads
- Publication number 20040200960
- Publication date Oct 14, 2004
- Marian Mankos
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for reducing substrate edge effects in electro...
- Publication number 20040149906
- Publication date Aug 5, 2004
- Marian Mankos
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
HIGH CONTRAST INSPECTION AND REVIEW OF MAGNETIC MEDIA AND HEADS
- Publication number 20040129877
- Publication date Jul 8, 2004
- Marian Mankos
- G01 - MEASURING TESTING
Information Patent Application
Electron beam lithography system having improved electron gun
- Publication number 20030048427
- Publication date Mar 13, 2003
- APPLIED MATERIALS, INC.
- Andres Fernandez
- B82 - NANO-TECHNOLOGY
Information Patent Application
Multiple electron beam lithography system with multiple beam modula...
- Publication number 20030042434
- Publication date Mar 6, 2003
- Marian Mankos
- B82 - NANO-TECHNOLOGY
Information Patent Application
Optical signal transmission for electron beam imaging apparatus
- Publication number 20020145113
- Publication date Oct 10, 2002
- APPLIED MATERIALS, INC.
- Jeffrey Sullivan
- B82 - NANO-TECHNOLOGY
Information Patent Application
GATE PHOTOCATHODE FOR CONTROLLED SINGLE AND MULTIPLE ELECTRON BEAM...
- Publication number 20010038263
- Publication date Nov 8, 2001
- KIM Y. LEE
- B82 - NANO-TECHNOLOGY

Marian Mankos

Person

Patents Grantslast 30 patents

Systems, devices, and methods for performing a non-contact electric...

Systems, devices, and methods for performing a non-contact electric...

Aberration reduction in multipass electron microscopy

Methods for performing a non-contact electrical measurement on a ce...

Compact arrangement for aberration correction of electron lenses

E-beam inspection apparatus and method of using the same on various...

Mirror pulse compressor for electron beam apparatus

Aberration-corrected and energy-filtered low energy electron micros...

Electron beam column and methods of using same

Mirror energy filter for electron beam apparatus

High-sensitivity and high-throughput electron beam inspection colum...

Compact arrangement for dual-beam low energy electron microscope

Mirror monochromator for charged particle beam apparatus

Shielding, particulate reducing high vacuum components

Shielding, particulate reducing high vacuum components

Electron beam apparatus and inspection method using dual illuminati...

Immersion gun equipped electron beam column

Reflective electron patterning device and method of using same

High-fidelity reflection electron beam lithography

High-resolution, low-distortion and high-efficiency optical couplin...

Electrical process monitoring using mirror-mode electron microscopy

Systems, control subsystems, and methods for projecting an electron...

Holey mirror arrangement for dual-energy e-beam inspector

Scanning electron microscope with curved axes

Electron beam lithography system having improved electron gun

Apparatus and method for tilted particle-beam illumination

Twisted-compensated low-energy electron microscope

High contrast inspection and review of magnetic media and heads

Dual-energy electron flooding for neutralization of charged substrate

Method and apparatus for reducing substrate edge effects in electro...

Patents Applicationslast 30 patents

SYSTEMS, DEVICES, AND METHODS FOR PERFORMING A NON-CONTACT ELECTRIC...

SYSTEMS, DEVICES, AND METHODS FOR PERFORMING A NON-CONTACT ELECTRIC...

SYSTEMS, DEVICES, AND METHODS FOR PERFORMING A NON-CONTACT ELECTRIC...

Aberration reduction in multipass electron microscopy

SYSTEMS, DEVICES, AND METHODS FOR PERFORMING A NON-CONTACT ELECTRIC...

ELECTRON BEAM COLUMN AND METHODS OF USING SAME

Shielding, Particulate Reducing High Vacuum Components

High-Sensitivity and High-Throughput Electron Beam Inspection Colum...

Systems, control subsystems, and methods for projecting an electron...

Electron beam lithography system having improved electron gun

High contrast inspection and review of magnetic media and heads

Method and apparatus for reducing substrate edge effects in electro...

HIGH CONTRAST INSPECTION AND REVIEW OF MAGNETIC MEDIA AND HEADS

Electron beam lithography system having improved electron gun

Multiple electron beam lithography system with multiple beam modula...

Optical signal transmission for electron beam imaging apparatus

GATE PHOTOCATHODE FOR CONTROLLED SINGLE AND MULTIPLE ELECTRON BEAM...