Marianne Unterreitmeier

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Woerth, DE

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Patents Grantslast 30 patents

Information Patent Grant
System and method for examining semiconductor substrates
- Patent number 10,859,534
- Issue date Dec 8, 2020
- Infineon Technologies AG
- Oliver Nagler
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SYSTEM AND METHOD FOR THE ACOUSTIC DETECTION OF CRACKS IN A SEMICON...
- Publication number 20220050083
- Publication date Feb 17, 2022
- INFINEON TECHNOLOGIES AG
- Oliver NAGLER
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEM AND METHOD FOR EXAMINING SEMICONDUCTOR SUBSTRATES
- Publication number 20190178848
- Publication date Jun 13, 2019
- INFINEON TECHNOLOGIES AG
- Oliver Nagler
- G01 - MEASURING TESTING