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Marie J. Welsch
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Georgetown, MA, US
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Patents Grants
last 30 patents
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Patent Grant
Ion beam implant current, spot width and position tuning
Patent number
7,442,944
Issue date
Oct 28, 2008
Varian Semiconductor Equipment Associates, Inc.
Shengwu Chang
H01 - BASIC ELECTRIC ELEMENTS
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Patent Grant
Ion beam contamination determination
Patent number
7,402,820
Issue date
Jul 22, 2008
Varian Semiconductor Equipment Associates, Inc.
Russell Low
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
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Patent Application
Ion beam contamination determination
Publication number
20070241276
Publication date
Oct 18, 2007
Russell Low
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Ion beam implant current, spot width and position tuning
Publication number
20060076510
Publication date
Apr 13, 2006
Shengwu Chang
H01 - BASIC ELECTRIC ELEMENTS