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EINDHOVEN, NL
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Patents Grants
last 30 patents
Information
Patent Grant
Detection circuit and integrated circuit
Patent number
11,668,765
Issue date
Jun 6, 2023
DATANG NXP SEMICONDUCTORS CO., LTD.
Dick Büthker
G01 - MEASURING TESTING
Information
Patent Grant
Accurate battery temperature measurement by compensating self heating
Patent number
11,515,585
Issue date
Nov 29, 2022
DATANG NXP SEMICONDUCTORS CO., LTD.
Marijn Nicolaas van Dongen
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Open wire detection system and method therefor
Patent number
11,047,919
Issue date
Jun 29, 2021
NXP B.V.
Henricus Cornelis Johannes Büthker
G01 - MEASURING TESTING
Information
Patent Grant
Angular sensor system and method of stray field cancellation
Patent number
10,816,363
Issue date
Oct 27, 2020
NXP B.V.
Jaap Ruigrok
G01 - MEASURING TESTING
Information
Patent Grant
Online supply current monitoring
Patent number
10,705,125
Issue date
Jul 7, 2020
NXP B.V.
Edwin Schapendonk
G01 - MEASURING TESTING
Information
Patent Grant
System for measuring angular position and method of stray field can...
Patent number
10,670,425
Issue date
Jun 2, 2020
NXP B.V.
Jaap Ruigrok
G01 - MEASURING TESTING
Information
Patent Grant
Resistive sensor frontend system having a resistive sensor circuit...
Patent number
10,317,482
Issue date
Jun 11, 2019
NXP B.V.
Marijn Nicolaas Van Dongen
H03 - BASIC ELECTRONIC CIRCUITRY
Patents Applications
last 30 patents
Information
Patent Application
DETECTION CIRCUIT AND INTEGRATED CIRCUIT
Publication number
20220404437
Publication date
Dec 22, 2022
Datang NXP Semiconductors Co., Ltd.
Dick Büthker
G01 - MEASURING TESTING
Information
Patent Application
BATTERY MANAGEMENT CIRCUIT AND BATTERY MODULE
Publication number
20220255143
Publication date
Aug 11, 2022
DATANG NXP SEMICONDUCTORS CO., LTD.
Marijn VAN DONGEN
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
ACCURATE BATTERY TEMPERATURE MEASUREMENT BY COMPENSATING SELF HEATING
Publication number
20200274207
Publication date
Aug 27, 2020
Datang NXP Semiconductors Co., Ltd.
Marijn Nicolaas van Dongen
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
OPEN WIRE DETECTION SYSTEM AND METHOD THEREFOR
Publication number
20200103466
Publication date
Apr 2, 2020
NXP B.V.
Henricus Cornelis Johannes Büthker
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SYSTEM FOR MEASURING ANGULAR POSITION AND METHOD OF STRAY FIELD CAN...
Publication number
20190301893
Publication date
Oct 3, 2019
NXP B.V.
Jaap Ruigrok
G01 - MEASURING TESTING
Information
Patent Application
ANGULAR SENSOR SYSTEM AND METHOD OF STRAY FIELD CANCELLATION
Publication number
20190265071
Publication date
Aug 29, 2019
NXP B.V.
Jaap Ruigrok
G01 - MEASURING TESTING
Information
Patent Application
RESISTIVE SENSOR FRONTEND SYSTEM HAVING A SIGMA-DELTA ANALOG-TO-DIG...
Publication number
20180143270
Publication date
May 24, 2018
NXP B.V.
MARIJN NICOLAAS VAN DONGEN
G01 - MEASURING TESTING