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Marijn WOUTERS
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Eindhoven, NL
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Patents Grants
last 30 patents
Information
Patent Grant
Inspection substrate and an inspection method
Patent number
10,725,390
Issue date
Jul 28, 2020
ASML Netherlands B.V.
Seerwan Saeed
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Lithography apparatus, a method of manufacturing a device and a con...
Patent number
10,534,270
Issue date
Jan 14, 2020
ASML Netherlands B.V.
Norbertus Josephus Martinus Van Den Nieuwelaar
G02 - OPTICS
Information
Patent Grant
Lithography apparatus and method of manufacturing a device
Patent number
10,261,422
Issue date
Apr 16, 2019
ASML Netherlands B.V.
Norbertus Josephus Martinus Van Den Nieuwelaar
G02 - OPTICS
Information
Patent Grant
Inspection substrate and an inspection method
Patent number
10,216,100
Issue date
Feb 26, 2019
ASML Netherlands B.V.
Seerwan Saeed
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
LITHOGRAPHY APPARATUS, A METHOD OF MANUFACTURING A DEVICE AND A CON...
Publication number
20190187568
Publication date
Jun 20, 2019
ASML NETHERLANDS B.V.
Norbertus Josephus Martinus VAN DEN NIEUWELAAR
G02 - OPTICS
Information
Patent Application
Inspection Substrate and an Inspection Method
Publication number
20190146352
Publication date
May 16, 2019
ASML NETHERLANDS B.V.
Seerwan Saeed
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
Inspection Substrate and an Inspection Method
Publication number
20180181004
Publication date
Jun 28, 2018
ASML NETHERLANDS B.V.
Seerwan SAEED
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
LITHOGRAPHY APPARATUS AND METHOD OF MANUFACTURING A DEVICE
Publication number
20170219933
Publication date
Aug 3, 2017
ASML NETHERLANDS B.V.
Norbertus Josephus Martinus VAN DEN NIEUWELAAR
G02 - OPTICS