TREA

Marik Balyasny

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  • Burbank, CA, US
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Patents Grantslast 30 patents

  • Information Patent Grant

    Contact arrangement
    • Patent number 5,942,905
    • Issue date Aug 24, 1999
    • ITT Corporation
    • Marik Balyasny
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Test clip with standard interface
    • Patent number 5,788,524
    • Issue date Aug 4, 1998
    • ITT Manufacturing Enterprises Inc.
    • Marik Balyasny
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Locking mechanism for IC test clip
    • Patent number 5,739,697
    • Issue date Apr 14, 1998
    • ITT Corporation
    • Marik Balyasny
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Flexible interface IC test clip
    • Patent number 5,497,104
    • Issue date Mar 5, 1996
    • ITT Corporation
    • Marik Balyasny
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Test clip contact arrangement
    • Patent number 5,453,700
    • Issue date Sep 26, 1995
    • ITT Corporation
    • Marik Balyasny
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Clip for small outline IC device
    • Patent number 5,423,688
    • Issue date Jun 13, 1995
    • ITT Industries, Inc.
    • Marik Balyasny
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Test clip for IC device
    • Patent number 5,415,560
    • Issue date May 16, 1995
    • ITT Corporation
    • Marik Balyasny
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Test clip for five pitch IC
    • Patent number 5,373,230
    • Issue date Dec 13, 1994
    • ITT Corporation
    • Marik Balyasny
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Lead termination
    • Patent number 5,026,301
    • Issue date Jun 25, 1991
    • ITT Corporation
    • Marik Balyasny
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Test clip for surface mount device
    • Patent number 4,996,476
    • Issue date Feb 26, 1991
    • ITT Corporation
    • Marik Balyasny
    • G01 - MEASURING TESTING