Mariko MARUKAWA

Person

  • Fukuchiyama-shi, JP

Patents Grantslast 30 patents

  • Information Patent Grant

    Optical measuring device

    • Patent number 11,231,270
    • Issue date Jan 25, 2022
    • Omron Corporation
    • Takahiro Okuda
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Sensor head

    • Patent number 10,663,285
    • Issue date May 26, 2020
    • Omron Corporation
    • Mariko Marukawa
    • G11 - INFORMATION STORAGE
  • Information Patent Grant

    Sensor head for positioning sensor

    • Patent number 10,571,247
    • Issue date Feb 25, 2020
    • Omron Corporation
    • Mariko Marukawa
    • G02 - OPTICS
  • Information Patent Grant

    Sensor head

    • Patent number 10,274,309
    • Issue date Apr 30, 2019
    • Omron Corporation
    • Mariko Marukawa
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Confocal measuring device

    • Patent number 10,247,602
    • Issue date Apr 2, 2019
    • Omron Corporation
    • Mariko Marukawa
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Optical measurement device

    • Patent number 9,995,624
    • Issue date Jun 12, 2018
    • Omron Corporation
    • Hisayasu Morino
    • G02 - OPTICS

Patents Applicationslast 30 patents

  • Information Patent Application

    SENSOR HEAD

    • Publication number 20190285399
    • Publication date Sep 19, 2019
    • Omron Corporation
    • Mariko MARUKAWA
    • G01 - MEASURING TESTING
  • Information Patent Application

    OPTICAL MEASURING DEVICE

    • Publication number 20190277621
    • Publication date Sep 12, 2019
    • Omron Corporation
    • Takahiro OKUDA
    • G01 - MEASURING TESTING
  • Information Patent Application

    SENSOR HEAD

    • Publication number 20190101374
    • Publication date Apr 4, 2019
    • Omron Corporation
    • Mariko MARUKAWA
    • G01 - MEASURING TESTING
  • Information Patent Application

    SENSOR HEAD

    • Publication number 20190101378
    • Publication date Apr 4, 2019
    • Omron Corporation
    • Mariko MARUKAWA
    • G01 - MEASURING TESTING
  • Information Patent Application

    CONFOCAL MEASURING DEVICE

    • Publication number 20180259390
    • Publication date Sep 13, 2018
    • Omron Corporation
    • Mariko MARUKAWA
    • G01 - MEASURING TESTING
  • Information Patent Application

    OPTICAL MEASUREMENT DEVICE

    • Publication number 20170160130
    • Publication date Jun 8, 2017
    • Omron Corporation
    • Hisayasu MORINO
    • G02 - OPTICS